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MCP621 数据表(PDF) 7 Page - Microchip Technology |
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MCP621 数据表(HTML) 7 Page - Microchip Technology |
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7 / 68 page ![]() 2009-2021 Microchip Technology Inc. and its subsidiaries DS20002188E-page 7 MCP621/1S/2/3/4/5/9 1.4 Test Circuits The circuit used for most DC and AC tests is shown in Figure 1-2. This circuit can independently set VCM and VOUT; see Equation 1-1. Note that VCM is not the circuit’s Common mode voltage ((VP +VM)/2), and that VOST includes VOS plus the effects (on the input offset error, VOST) of temperature, CMRR, PSRR and AOL. EQUATION 1-1: FIGURE 1-2: AC and DC Test Circuit for Most Specifications. GDM RF RG = VCM VP VDD 2 + 2 = VOUT VDD 2 VP VM – V OST 1GDM + ++ = Where: GDM = Differential Mode Gain (V/V) VCM = Op Amp’s Common Mode Input Voltage (V) VOST = Op Amp’s Total Input Offset Voltage (mV) VOST VIN– VIN+ – = VDD RG RF VOUT VM CB2 CL RL VL CB1 10 k 10 k RG RF VDD/2 VP 10 k 10 k 50 pF 2k 2.2 µF 100 nF VIN– VIN+ CF 6.8 pF CF 6.8 pF MCP62X |
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