STM32F103C8T6 datasheet(40/67 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F103xx

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5.3.10

EMC characteristics

Susceptibility tests are performed on a sample basis during device characterization.

Functional EMS (electromagnetic susceptibility)

While a simple application is executed on the device (toggling 2 LEDs through I/O ports). the

device is stressed by two electromagnetic events until a failure occurs. The failure is

indicated by the LEDs:

●

Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until

a functional disturbance occurs. This test is compliant with the IEC 1000-4-2 standard.

●

FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD and

VSS through a 100 pF capacitor, until a functional disturbance occurs. This test is

compliant with the IEC 1000-4-4 standard.

A device reset allows normal operations to be resumed.

The test results are given in Table 25. They are based on the EMS levels and classes

defined in application note AN1709.

Designing hardened software to avoid noise problems

EMC characterization and optimization are performed at component level with a typical

application environment and simplified MCU software. It should be noted that good EMC

performance is highly dependent on the user application and the software in particular.

Therefore it is recommended that the user applies EMC software optimization and

prequalification tests in relation with the EMC level requested for his application.

Software recommendations

The software flowchart must include the management of runaway conditions such as:

●

Corrupted program counter

●

Unexpected reset

●

Critical Data corruption (control registers...)

Table 25.

EMS characteristics(1)

TBD stands for to be determined.

Symbol

Parameter

Conditions

Level/

Class

VFESD

Voltage limits to be applied on any I/O pin to

induce a functional disturbance

VDD = 3.3 V, TA = +25 °C,

fHCLK=48 MHz

conforms to IEC 1000-4-2

TBD

VEFTB

Fast transient voltage burst limits to be

applied through 100pF on VDD and VSS pins

to induce a functional disturbance

VDD = 3.3 V, TA = +25 °C,

fHCLK = 48 MHz

conforms to IEC 1000-4-4

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