STM32F103C8T6 datasheet(42/67 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32F103xx

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5.3.11

Absolute maximum ratings (electrical sensitivity)

Based on three different tests (ESD, LU) using specific measurement methods, the device is

stressed in order to determine its performance in terms of electrical sensitivity.

Electrostatic discharge (ESD)

Electrostatic discharges (a positive then a negative pulse separated by 1 second) are

applied to the pins of each sample according to each pin combination. The sample size is

either 3 parts (cumulative mode) or 3 parts × (n + 1) supply pins (non-cumulative mode).

The human body model (HBM) can be simulated. The tests are compliant with JESD22-

A114A standard.

For more details, refer to the application note AN1181.

Static latch-up

Two complementary static tests are required on six parts to assess the latch-up

performance:

●

A supply overvoltage is applied to each power supply pin

●

A current injection is applied to each input, output and configurable I/O pin

These tests are compliant with EIA/JESD 78A IC latch-up standard.

Table 27.

ESD absolute maximum ratings(1)

TBD stands for to be determined.

Symbol

Ratings

Conditions

Maximum value(2)

Values based on characterization results, not tested in production.

Unit

VESD(HBM)

Electrostatic discharge voltage

(human body model)

TA = +25 °C

2000

VESD(CDM)

Electrostatic discharge voltage

(charge device model)

TBD

Table 28.

Electrical sensitivities

Symbol

Parameter

Conditions

Class

Static latch-up class

TA = +105 °C

II level A

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