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ADS5271 数据表(PDF) 10 Page - Texas Instruments |
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ADS5271 数据表(HTML) 10 Page - Texas Instruments |
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10 / 42 page ![]() t H1 t SU1 t H2 t SU2 LCLK N LCLK P OUT N OUT P 0 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 0 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 0 0 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 Sample n Sample n+12 t PROP t (A) D 12clockslatency AnalogInput ClockInput 6XADCLK LCLK N LCLK P 1XADCLK ADCLK N ADCLK P SERIAL DATA OUT P OUT N t SAMPLE Sample n+13 ADS5287 SBAS428D – JANUARY 2008 – REVISED JUNE 2012 www.ti.com LVDS TIMING DIAGRAM DEFINITION OF SETUP AND HOLD TIMES tSU = min(tSU1, tSU2) tH = min(tH1, tH2) TIMING CHARACTERISTICS (1) ADS5287 PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tA Aperture delay 1.5 4.5 ns Aperture delay variation Channel-to-channel within the same device (3 σ) ±20 ps tJ Aperture jitter 400 fs Time to valid data after coming out of 50 μs COMPLETE POWER-DOWN mode Time to valid data after coming out of PARTIAL tWAKE Wake-up time POWER-DOWN mode (with clock continuing to 2 μs run during power-down) Time to valid data after stopping and restarting 40 μs the input clock Clock Data latency 12 cycles (1) Timing parameters are ensured by design and characterization; not production tested. 10 Copyright © 2008–2012, Texas Instruments Incorporated |
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