STR910FAM32 datasheet(69/99 Pages) STMICROELECTRONICS

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Electrical characteristics

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7.9

EMC characteristics

Susceptibility tests are performed on a sample basis during product characterization.

7.9.1

Functional EMS (electro magnetic susceptibility)

Based on a simple running application on the product (toggling 2 LEDs through I/O ports),

the product is stressed by two electro magnetic events until a failure occurs (indicated by the

LEDs).

●

ESD: Electro-Static Discharge (positive and negative) is applied on all pins of the

device until a functional disturbance occurs. This test conforms with the IEC 1000-4-2

standard.

●

FTB: A Burst of Fast Transient voltage (positive and negative) is applied to VDD, VDDQ

and VSS through a 100pF capacitor, until a functional disturbance occurs. This test

conforms with the IEC 1000-4-4 standard.

A device reset allows normal operations to be resumed.

7.9.2

Electro magnetic interference (EMI)

Based on a simple application running on the product (toggling 2 LEDs through the I/O

ports), the product is monitored in terms of emission. This emission test is in line with the

norm SAE J 1752/3 which specifies the board and the loading of each pin.

Table 26.

EMS data

Symbol

Parameter

Conditions

Severity/

Criteria(1)

Unit

VFESD

Voltage limits to be applied on

any I/O pin to induce a functional

disturbance

VDD=1.8V, VDDQ=3.3V, TA=+25°C,

fOSC/fCPUCLK =4 MHz/96MHz PLL

VFFTB

Fast transient voltage burst limits

to be applied through 100pF on

VDD and VDDQ pins to induce a

functional disturbance

VDD=1.8V, VDDQ=3.3V, TA=+25°C,

fOSC/fCPUCLK =4 MHz/96 MHz PLL

conforms to IEC 1000-4-4

Data based on characterization results, not tested in production.

Table 27.

EMI data

Symbo

Parameter

Conditions

Monitored

Frequency Band

Max vs.

[fOSC/fCPUCLK]

Unit

24 MHz /

48 MHz(1)

24 MHz /

96 MHz(1)

SEMI

Peak level

VDDQ=3.3V, VDD=1.8V,

TA=+25°C,

LQFP128 package(2)

conforming to SAE J

1752/3

0.1MHz to 30 MHz

µV

30 MHz to 130

MHz

130 MHz to 1GHz

SAE EMI Level

Data based on characterization results, not tested in production.

BGA and LQFP devices have similar EMI characteristics.

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