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BQ28Z610-R1 数据表(PDF) 19 Page - Texas Instruments |
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BQ28Z610-R1 数据表(HTML) 19 Page - Texas Instruments |
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19 / 38 page ![]() CAUTION If the device is configured as a single-master architecture (an application processor) and an occasional NACK is detected in the operation, the master can resend the transaction. However, in a multi-master architecture, an incorrect ACK leading to accidental loss of bus arbitration can cause a master to wait incorrectly for another master to clear the bus. If this master does not get a bus-free signal, then it must have in place a method to look for the bus and assume it is free after some period of time. Also, if possible, set the clock speed to be 100 kHz or less to significantly reduce the issue described above for multi-mode operation. 8.3.12 I2C Timeout The I2C engine will release both SDA and SCL if the I2C bus is held low for ~2 seconds. If the BQ28Z610-R1 device were holding the lines, releasing them frees the master to drive the lines. Note: that the low time setting can be under firmware control but the HW default is 2 seconds. 8.3.13 Cell Balancing Support The integrated cell balancing FETs included in the BQ28Z610-R1 device enable the AFE to bypass cell current around a given cell or numerous cells to effectively balance the entire battery stack. External series resistors placed between the cell connections and the VCx input pins set the balancing current magnitude. The cell balancing circuitry can be enabled or disabled via the CELL_BAL_DET[CB2, CB1] control register. Series input resistors between 100 Ω and 1 kΩ are recommended for effective cell balancing. VC1 VC2 VSS Figure 8-3. Internal Cell Balancing 8.3.14 N-Channel Protection FET Drive The BQ28Z610-R1 device controls two external N-Channel MOSFETs in a back-to-back configuration for battery protection. The charge (CHG) and discharge (DSG) FETs are automatically disabled if a safety fault (AOLD, ASSC, ASCD, SOV) is detected, and can also be manually turned off using AFE_CONTROL[CHGEN, DSGEN] = 0, 0. When the gate drive is disabled, an internal circuit discharges CHG to VC2 and DSG to PACK. 8.3.15 Low Frequency Oscillator The BQ28Z610-R1 AFE includes a low frequency oscillator (LFO) running at 262.144 kHz. The AFE monitors the LFO frequency and indicates a failure via LATCH_STATUS[LFO] if the output frequency is much lower than normal. 8.3.16 High Frequency Oscillator The BQ28Z610-R1 AGG includes a high frequency oscillator (HFO) running at 16.78 MHz. It is synthesized from the LFO output and scaled down to 8.388 MHz with 50% duty cycle. www.ti.com BQ28Z610-R1 SLUSE07B – JANUARY 2020 – REVISED JANUARY 2022 Copyright © 2022 Texas Instruments Incorporated Submit Document Feedback 19 Product Folder Links: BQ28Z610-R1 |
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