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CDCLVC1102 数据表(PDF) 5 Page - Texas Instruments

部件名 CDCLVC1102
功能描述  CDCLVC11xx 3.3-V and 2.5-V LVCMOS High-Performance Clock Buffer Family
PDF  37 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

CDCLVC1102 数据表(HTML) 5 Page - Texas Instruments

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CDCLVC1102, CDCLVC1103, CDCLVC1104
CDCLVC1106, CDCLVC1108, CDCLVC1110, CDCLVC1112
www.ti.com
SCAS895B – MAY 2010 – REVISED FEBRUARY 2017
Product Folder Links: CDCLVC1102 CDCLVC1103 CDCLVC1104 CDCLVC1106 CDCLVC1108 CDCLVC1110
CDCLVC1112
Submit Documentation Feedback
Copyright © 2010–2017, Texas Instruments Incorporated
(1)
Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating
Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
This value is limited to 4.6 V maximum.
6 Specifications
6.1 Absolute Maximum Ratings
over operating free-air temperature range (unless otherwise noted)
(1)
MIN
MAX
UNIT
VDD
Supply voltage
–0.5
4.6
V
VIN
Input voltage(2)
–0.5
VDD + 0.5
V
VO
Output voltage(2)
–0.5
VDD + 0.5
V
IIN
Input current
–20
20
mA
IO
Continuous output current
–50
50
mA
TJ
Maximum junction temperature
125
°C
Tstg
Storage temperature
–65
150
°C
(1)
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.
(2)
JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.
6.2 ESD Ratings
VALUE
UNIT
V(ESD)
Electrostatic discharge
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)
±4000
V
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)
±1500
6.3 Recommended Operating Conditions
over operating free-air temperature range (unless otherwise noted)
MIN
NOM
MAX
UNIT
VDD
Supply voltage
3.3-V supply
3.0
3.3
3.6
V
2.5-V supply
2.3
2.5
2.7
VIL
Low-level input voltage
VDD = 3.0 V to 3.6 V
VDD/2 – 600
mV
VDD = 2.3 V to 2.7 V
VDD/2 – 400
VIH
High-level input voltage
VDD = 3.0 V to 3.6 V
VDD/2 + 600
mV
VDD = 2.3 V to 2.7 V
VDD/2 + 400
Vth
Input threshold voltage
VDD = 2.3 V to 3.6 V
VDD/2
mV
tr / tf
Input slew rate
1
4
V/ns
tw
Minimum pulse width at
CLKIN
VDD = 3.0 V to 3.6 V
1.8
ns
VDD = 2.3 V to 2.7 V
2.75
fCLK
LVCMOS clock Input
Frequency
VDD = 3.0 V to 3.6 V
DC
250
MHz
VDD = 2.3 V to 2.7 V
DC
180
TA
Operating free-air temperature
–40
85
°C



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