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CDCLVC1102 数据表(PDF) 6 Page - Texas Instruments

部件名 CDCLVC1102
功能描述  CDCLVC11xx 3.3-V and 2.5-V LVCMOS High-Performance Clock Buffer Family
PDF  37 Pages
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制造商  TI2 [Texas Instruments]
网页  https://www.ti.com
标志 TI2 - Texas Instruments

CDCLVC1102 数据表(HTML) 6 Page - Texas Instruments

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CDCLVC1102, CDCLVC1103, CDCLVC1104
CDCLVC1106, CDCLVC1108, CDCLVC1110, CDCLVC1112
SCAS895B – MAY 2010 – REVISED FEBRUARY 2017
www.ti.com
Product Folder Links: CDCLVC1102 CDCLVC1103 CDCLVC1104 CDCLVC1106 CDCLVC1108 CDCLVC1110
CDCLVC1112
Submit Documentation Feedback
Copyright © 2010–2017, Texas Instruments Incorporated
(1)
For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report.
(2)
The junction-to-ambient thermal resistance under natural convection is obtained in a simulation on a JEDEC-standard, high-K board, as
specified in JESD51-7, in an environment described in JESD51-2a.
(3)
The junction-to-case (top) thermal resistance is obtained by simulating a cold plate test on the package top. No specific JEDEC-
standard test exists, but a close description can be found in the ANSI SEMI standard G30-88.
6.4 Thermal Information
THERMAL METRIC(1)
CDCLVC1102
CDCLVC1103
CDCLVC1104
CDCLVC1106
CDCLVC1108
CDCLVC11010
CDCLVC1112
UNIT
PW (TSSOP)
8 PINS
14 PINS
16 PINS
20 PINS
24 PINS
RθJA
Junction-to-ambient thermal
resistance(2)
149.4
112.6
108.4
83.0
87.9
°C/W
RθJC(top)
Junction-to-case(top) thermal
resistance (3)
69.4
48.0
33.6
32.3
26.5
°C/W
(1)
All typical values are at respective nominal VDD. For switching characteristics, outputs are terminated to 50 Ω to VDD/2 (see Figure 3).
(2)
For dynamic IDD over frequency see and Figure 1.
(3)
This is the formula for the power dissipation calculation (see and the Power Considerations section).
Ptot = Pstat + Pdyn + PCload [W]
Pstat = VDD × IDD [W]
Pdyn = CPD × VDD2 × ƒ [W]
PCload = Cload × VDD2 × ƒ × n [W]
n = Number of switching output pins
6.5 Electrical Characteristics
Over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN TYP(1)
MAX
UNIT
OVERALL PARAMETERS FOR ALL VERSIONS
IDD
Static device current(2)
1G = VDD; CLKIN = 0 V or VDD; IO = 0 mA; VDD = 3.6 V
6
10
mA
1G = VDD; CLKIN = 0 V or VDD; IO = 0 mA; VDD = 2.7 V
3
6
IPD
Power-down current
1G = 0 V; CLKIN = 0 V or VDD; IO = 0 mA; VDD = 3.6 V or 2.7 V
60
µA
CPD
Power dissipation capacitance
per output(3)
VDD = 3.3 V; f = 10 MHz
6
pF
VDD = 2.5 V; f = 10 MHz
4.5
II
Input leakage current at 1G
VI = 0 V or VDD, VDD = 3.6 V or 2.7 V
8
8
µA
Input leakage current at CLKIN
25
25
ROUT Output impedance
VDD = 3.3 V
45
Ω
VDD = 2.5 V
60
fOUT
Output frequency
VDD = 3 V to 3.6 V
DC
250
MHz
VDD = 2.3 V to 2.7 V
DC
180
OUTPUT PARAMETERS FOR VDD = 3.3 V ± 0.3 V
VOH
High-level output voltage
VDD = 3 V, IOH = –0.1 mA
2.9
V
VDD = 3 V, IOH = –8 mA
2.5
VDD = 3 V, IOH = –12 mA
2.2
VOL
Low-level output voltage
VDD = 3 V, IOL = 0.1 mA
0.1
V
VDD = 3 V, IOL = 8 mA
0.5
VDD = 3 V, IOL = 12 mA
0.8
OUTPUT PARAMETERS FOR VDD = 2.5 V ± 0.2 V
VOH
High-level output voltage
VDD = 2.3 V, IOH = –0.1 mA
2.2
V
VDD = 2.3 V, IOH = –8 mA
1.7
VOL
Low-level output voltage
VDD = 2.3 V, IOL = 0.1 mA
0.1
V
VDD = 2.3 V, IOL = 8 mA
0.5



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