ADGM3121BCCZ-R2 datasheet(26/33 Pages) AD

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Data Sheet

ADGM3121

APPLICATIONS INFORMATION

analog.com

Rev. 0 | 26 of 33

POWER SUPPLY RAILS

The ADGM3121 can operate with unipolar supplies between 3.0V

and 3.6V. The device is fully specified at a 3.3V analog supply

voltage.

POWER SUPPLY RECOMMENDATIONS

Analog Devices has a wide range of power management products

to meet the requirements of most high performance signal chains.

Figure 70 shows an example of a unipolar solution for the

ADGM3121. The ADP7142 is a low dropout linear regulator that

operates from 2.7V to 40V and is ideal for the regulation of high

performance analog and mixed-signal circuits operating from 39V

down to 1.2V rails. The ADP7142 has 11µV rms output noise

independent of the output voltage. The ADP7142 can be used to

power the supply rail for the ADGM3121, a microcontroller, and/or

other devices in the signal chain.

Figure 70. Unipolar Power Solution

If low noise performance at the power supply is required, the

ADP7142 can be replaced by the LT1962 or LT3045-1.

Table 8. Recommended Power Management Devices

Product

Description

ADP7142

40V, 200mA, low noise, CMOS LDO linear regulator

LT1962

300mA, low noise, micropower, low dropout (LDO) regulator

LT3045-1

20V, 500mA, ultra-low noise, ultra-high power supply rejection

ratio (PSRR) linear regulator with voltage for input to output

control (VIOC)

HIGH-SPEED DIGITAL LOOPBACK

Testing high-speed input and output (HSIO) interfaces, such as

peripheral component interconnect express (PCIe) Gen 4.0 and

PCIe Gen 5.0, in a high volume manufacturing environment is a

challenge. A common approach to validate an HSIO interface is

the implementation of a high-speed loopback test method. This in-

corporates both high-speed and DC test paths in one configuration.

To perform high-speed loopback testing, generally a pseudorandom

bit sequence (PRBS) is transmitted at high speed from the transmit-

ter and received at the receiver end after being looped back on

the load board or test board. At the receiver end, the sequence is

analyzed to calculate the bit error rate (BER).

DC parametric tests are performed on the input and output pins,

such as a continuity test and a leakage test, to ensure device

functionality. To perform these tests, the input/output pins of the

DUT must be connected directly to a DC instrument where the DC

measurement of the input/output pin is executed.

The ADGM3121 offers both high speed digital and DC testing

capability with superior density in a small 3mm × 3mm × 1.5mm

LGA package, as shown in Figure 71. The MEMS switch also

enables communication from the tester to the device under test

(DUT). The ADGM3121 provides excellent performance from DC to

24GHz, which allows the switch to handle both high-speed signals

up to 64Gbps and precision DC signals.

Figure 71. ADGM3121 Enabling Both High-Speed Digital and DC Testing

PIN ELECTRONICS (PE) AND PARAMETRIC

MEASUREMENT UNIT (PMU) SIGNAL

SWITCHING

The ADGM3121 delivers exceptional performance for PE and PMU

signal switching applications. Its low on-resistance and minimal

capacitance ensure high signal integrity, maintaining low insertion

loss and supporting fast edge rates with reduced timing errors.

High off-state isolation minimizes leakage and crosstalk, enabling

accurate and reliable measurements. As shown in Figure 72, a

four-channel high-speed path drives the DUT’s four Rx ports for

precise functional and performance validation. Alternatively, these

Rx ports can be rerouted to individual four-channel PMU ports

to facilitate parametric testing, such as leakage, threshold, and

voltage level measurements. This flexibility allows both high-speed

digital and low-speed DC testing on a single hardware platform,

reducing equipment requirements and increasing throughput.

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