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LTC6754ISC6#TRMPBF 数据表(PDF) 16 Page - Analog Devices

部件名 LTC6754ISC6#TRMPBF
功能描述  High Speed Rail-to-Rail Input Comparator with LVDS Compatible Outputs
PDF  22 Pages
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网页  http://www.analog.com
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LTC6754ISC6#TRMPBF 数据表(HTML) 16 Page - Analog Devices

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LTC6754
16
6754f
For more information www.linear.com/LTC6754
Typical applicaTions
High Speed Clock Recovery and Level Translation
Circuit
High speed comparators are often used in digital systems
torecoverdistortedclockwaveforms.TheLTC6754canbe
used to recover a distorted TTL clock signal, and translate
it into a signal suitable for driving an LVDS receiver.
In this application, an input clock signal is required to drive
an LVDS receiver. If the input signal gets distorted and
its amplitude severely reduced due to stray capacitance,
stray inductance or due to reflections on the transmission
line, the LTC6754 can be used to convert it into a full scale
LVDS signal that can drive the receiver.
Figure  10 shows the input and output waveforms of
the LTC6754, used to recover a 400mVP–P 340MHz
(680Mbps) corrupted clock signal, into a full scale LVDS
output signal. AC-coupling could have been used at the
input of the comparator, however to preserve input duty
cycle information DC-coupling may be preferable, and
that is where having a wide input common mode range
is an advantage. The input to output delay on the graph
is larger than the actual propagation delay. The additional
delay is due to the measurement cables.
VCCI V
CCO
VEE + 3.3V
6754 F09
340MHz
CLOCK INPUT
VEE
VREF = 200mV
LTC6754
100
+
Q
Q
LTC6754
Figure 9. Corrupted Clock Recovery to LVDS Translator Circuit.
1ns/DIV
INPUT
200mV/DIV
0V
Q OUTPUT
Q OUTPUT
100mV/DIV
VOCM = 1.25V
6754 F10
Figure 10. LVDS Output at 340MHz
in parallel with multiple low ESL, low ESR 100nF capaci-
tors connected as close to the supply pins as possible
to minimize trace impedance is recommended. In many
applications the VEE pin will be connected to ground. In
applications where the VEE pin is not connected to ground,
the positive supplies should still be bypassed to VEE. The
VEE pin should also then be bypassed to a ground plane
with a 2.2μF capacitor in parallel with low ESL, low ESR
100nF capacitors if possible.
Fordeviceswithseparatepositiveinputandoutputsupplies,
bypass capacitors should be placed from each positive
supply to VEE. Capacitors should NOT be placed between
the two positive supplies; otherwise disturbances due to
output switching can couple back to the inputs.
When the input slew rate is small, sustained oscillations
can occur at the output pin while the input is transitioning
due to even one millivolt of ground bounce. For applica-
tions where the input slew rate is low, internal hysteresis
should not be removed by taking the LE/HYST pin high,
as the addition of hysteresis makes the comparators more
immune to disturbances such as ground bounce. Increas-
ing hysteresis by adjusting the LE/HYST pin voltage or by
adding positive feedback as discussed in the section on
hysteresiscanfurtherimprovenoiseimmunity.Whenadd-
ing positive feedback, surface mounted resistors should
be used for R1 and R2 in Figure 6. The resistors should
be as close to the device as possible.
applicaTions inForMaTion



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