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MPC8309CVMADDC 数据表(PDF) 19 Page - NXP Semiconductors |
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MPC8309CVMADDC 数据表(HTML) 19 Page - NXP Semiconductors |
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19 / 81 page ![]() MPC8309 PowerQUICC II Pro Integrated Communications Processor Family Hardware Specifications, Rev. 3 Freescale Semiconductor 19 Local Bus 7 Local Bus This section describes the DC and AC electrical specifications for the local bus interface of the MPC8309. 7.1 Local Bus DC Electrical Characteristics The following table provides the DC electrical characteristics for the local bus interface. 7.2 Local Bus AC Electrical Specifications The following table describes the general timing parameters of the local bus interface of the MPC8309. Table 17. Local Bus DC Electrical Characteristics Parameter Symbol Min Max Unit High-level input voltage VIH 2OVDD +0.3 V Low-level input voltage VIL –0.3 0.8 V High-level output voltage, IOH = –100 AVOH OVDD –0.2 — V Low-level output voltage, IOL =100 AVOL —0.2 V Input current IIN —±5 A Table 18. Local Bus General Timing Parameters Parameter Symbol1 Min Max Unit Note Local bus cycle time tLBK 15 — ns 2 Input setup to local bus clock (LCLKn)tLBIVKH 7 — ns 3, 4 Input hold from local bus clock (LCLKn)tLBIXKH 1.0 — ns 3, 4 LALE output fall to LAD output transition (LATCH hold time) tLBOTOT 1.5 — ns LALE output rise to LCLK negative edge tLALEHOV —3 ns — LALE output fall to LCLK negative edge tLALETOT -1.5 — ns — Local bus clock (LCLKn) to output valid tLBKHOV —3 ns 3 Local bus clock (LCLKn) to output high impedance for LAD/LDP tLBKHOZ —4 ns 5 Notes : 1. The symbols used for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state)(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tLBIXKH1 symbolizes local bus timing (LB) for the input (I) to go invalid (X) with respect to the time the tLBK clock reference (K) goes high (H), in this case for clock one(1). 2. All timings are in reference to falling edge of LCLK0 (for all outputs and for LGTA and LUPWAIT inputs) or rising edge of LCLK0 (for all other inputs). 3. All signals are measured from OVDD/2 of the rising/falling edge of LCLK0 to 0.4 OVDD of the signal in question for 3.3-V signaling levels. 4. Input timings are measured at the pin. 5. For purposes of active/float timing measurements, the Hi-Z or off state is defined to be when the total current delivered through the component pin is less than or equal to the leakage current specification. |
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