ADIS16228SLASHPCBZ datasheet(25/28 Pages) AD

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Data Sheet

ADIS16228

Rev. B | Page 25 of 28

SELF-TEST

Set GLOB_CMD[2] = 1 (DIN = 0xBE02) (see Table 64) to run

an automatic self-test routine, which reports a pass/fail result to

DIAG_STAT[5] (see Table 65).

FLASH MEMORY MANAGEMENT

Set GLOB_CMD[5] = 1 (DIN = 0xBE20) to run an internal

checksum test on the flash memory, which reports a pass/fail

result to DIAG_STAT[6]. The FLASH_CNT register (see Table 68)

provides a running count of flash memory write cycles. This is a

tool for managing the endurance of the flash memory. Figure 23

quantifies the relationship between data retention and junction

temperature.

Table 68. FLASH_CNT (Base Address = 0x00), Read Only

Bits

Description

[15:0]

Binary counter for writing to flash memory

600

450

300

150

JUNCTION TEMPERATURE (°C)

100

125

135

150

Figure 23. Flash®/EE Memory Data Retention

DEVICE IDENTIFICATION

Table 69. LOT_ID1 (Base Address = 0x52), Read Only

Bits

Description

[15:0]

Lot identification code

Table 70. LOT_ID2 (Base Address = 0x54), Read Only

Bits

Description

[15:0]

Lot identification code

Table 71. PROD_ID (Base Address = 0x56), Read Only

Bits

Description (Default = 0x3F64)

[15:0]

0x3F64 = 16,228

Table 72. SERIAL_NUM (Base Address = 0x58), Read Only

Bits

Description

[15:0]

Serial number, lot specific

Table 73 shows a blank register that is available for writing user-

specific identification.

Table 73. USER_ID (Base Address = 0x5C), Read/Write

Bits

Description (Default = 0x000)

[15:0]

User-written identification

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