LMP91051

SNAS581A – MARCH 2012 – REVISED NOVEMBER 2012

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Electrical Characteristics

(1)

Min

Typ

Max

Symbol

Parameter

Conditions

Units

(2)

(3)

(2)

Power Supply

VDD

Supply Voltage

2.7

3.3

5.5

V

VIO

Digital I/O supply

2.7

3.3

5.5

V

IDD

Supply Current

All analog block ON

3.1

3.6

4.2

mA

Power Down Supply Current

All analog block OFF

45

75

121

μA

Digital Supply Current

8

μA

Offset Cancellation (Offset DAC)

Resolution

256

steps

LSB

All gains

33.8

mV

DNL

−1

+2

LSB

Error

Output referred offset error, all gains

±100

mV

VDD

−

Offset adjust range

Output referred, all gains

0.2

V

0.2

DAC settling time

480

μs

IBIAS

Bias Current

50

200

pA

VINMAX

Max input signal High gain

Referenced to CMOUT voltage, it refers to the

±2

mV

_HGM

mode

maximum voltage at the IN pin before clipping; It

includes dark voltage of the thermopile and

VINMAX

Max input signal Low gain

±12

mV

signal voltage.

_LGM

mode

VOS

Input Offset Voltage

-165

µV

G _HGM

Gain High gain mode

250

V/V

G_LGM

Gain Low gain mode

42

V/V

GE

Gain Error

Both HGM and LGM

2.5

%

VDD –

VOUT

Output Voltage Range

0.5

0.5

V

1mV input step signal, HGM, Vout measured at

PhDly

Phase Delay

6

μs

Vdd/2

Phase Delay variation with

1mV input step signal, HGM, Vout measured at

TCPhDly

416

ns

Temperature

Vdd/2,

SSBW

Small Signal Bandwidth

Vin = 1mVpp, Gain = 250 V/V

18

kHz

Cin

Input Capacitance

100

pF

VINMAX

Max input signal

GAIN = 4 V/V

1.65

V

VINMIN

Min input signal

0.82

V

G

Gain

Programmable in 4 steps

4

32

V/V

GE

Gain Error

Any gain

2.5

%

VDD –

VOUT

Output Voltage Range

0.2

V

0.2

100mV input sine 35kHz signal, Gain = 8, VOUT

PhDly

Phase Delay

1

µs

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

device may be permanently degraded, either mechanically or electrically.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

6

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