LMP91051

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SNAS581A – MARCH 2012 – REVISED NOVEMBER 2012

Timing Characteristics

(1)

Min

Typ

Max

Symbol

Parameter

Conditions

Units

(2)

(3)

(2)

Wake up time

1

ms

Serial Clock Frequency

10

MHz

SCLK Pulse Width High

ns

SCLK Pulse Width Low

ns

CSB Setup Time

10

ns

CSB Hold Time

10

ns

SDI Setup Time prior to rise

10

ns

edge of SCLK

SDI Hold Time prior to rise

10

ns

edge of SCLK

SDO Disable Time after rise

45

ns

edge of CSB

45

ns

rise edge of SCLK

SDO Enable Time from the fall

35

ns

SDO Access Time after the fall

35

ns

edge of SCLK

SDO hold time after the fall

5

ns

edge of SCLK

SDO Rise time

5

ns

SDO Fall time

5

ns

(1)

Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very

device may be permanently degraded, either mechanically or electrically.

(2)

Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using

statistical quality control (SQC) method.

(3)

Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary

over time and will also depend on the application and configuration. The typical values are not tested and are not guaranteed on

shipped production material.

Copyright © 2012, Texas Instruments Incorporated

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