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STM32F372VB 数据表(PDF) 103 Page - STMicroelectronics

部件名 STM32F372VB
功能描述  ARM Cortex-M4F 32b MCUFPU, up to 256KB Flash32KB SRAM timers
PDF  128 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

STM32F372VB 数据表(HTML) 103 Page - STMicroelectronics

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STM32F37x
Electrical characteristics
Doc ID 022691 Rev 3
103/128
6.3.20
Temperature sensor characteristics
6.3.21
VBAT monitoring characteristics
6.3.22
Timer characteristics
The parameters given in Table 68 are guaranteed by design.
Refer to Section 6.3.14: I/O port characteristics for details on the input/output alternate
function characteristics (output compare, input capture, external clock, PWM output).
Table 65.
Temperature sensor calibration values
Calibration value name
Description
Memory address
TS_CAL1
TS ADC raw data acquired at
temperature of 30 °C,
VDDA= 3.3 V
0x1FFF F7B8 - 0x1FFF F7B9
TS_CAL2
TS ADC raw data acquired at
temperature of 110 °C
VDDA= 3.3 V
0x1FFF F7C2 - 0x1FFF F7C3
Table 66.
TS characteristics
Symbol
Parameter
Min
Typ
Max
Unit
TL
VSENSE linearity with temperature
1
2°C
Avg_Slope(1)
Average slope
4.0
4.3
4.6
mV/°C
V25
Voltage at 25 °C
1.34
1.43
1.52
V
tSTART
(1)
1.
Guaranteed by design, not tested in production.
Startup time
4
10
µs
TS_temp
(2)(1)
2.
Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the
temperature
17.1
µs
Table 67.
VBAT monitoring characteristics
Symbol
Parameter
Min
Typ
Max
Unit
R
Resistor bridge for VBAT
-50-
K
Q
Ratio on VBAT measurement
-
2
-
Er(1)
1.
Guaranteed by design, not tested in production.
Error on Q
-1
-
+1
%
TS_vbat
(2)
2.
Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when reading the VBAT
1mV accuracy
5-
-
µs



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