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JS28F512P30TFA 数据表(PDF) 49 Page - Micron Technology

部件名 JS28F512P30TFA
功能描述  Numonyx Axcell P30-65nm Flash Memory
PDF  86 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  MICRON [Micron Technology]
网页  http://www.micron.com
标志 MICRON - Micron Technology

JS28F512P30TFA 数据表(HTML) 49 Page - Micron Technology

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Datasheet
Sept 2012
49
Order Number:208042-0
6
P30-65nm
15.0
AC Characteristics
15.1
AC Test Conditions
Note:
AC test inputs are driven at VCCQ for Logic "1" and 0 V for Logic "0". Input/output timing begins/ends at VCCQ/2. Input
rise and fall times (10% to 90%) < 5ns. Worst-case speed occurs at VCC = VCCMin.
Notes:
1.
See the following table for component values.
2.
Test configuration component value for worst-case speed conditions.
3.
CL includes jig capacitance
.
Figure 15: AC Input/Output Reference Waveform
Figure 16: Transient Equivalent Testing Load Circuit
Table 23: Test Configuration Component Value for Worst-Case Speed Conditions
Test Configuration
CL (pF)
VCCQ Min Standard Test
30
IO_REF.WMF
Input V
CCQ/2
V
CCQ/2 Output
V
CCQ
0V
Test Points
Device
Under Test
Out
C
L



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