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JS28F512P30TFA 数据表(PDF) 5 Page - Micron Technology |
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JS28F512P30TFA 数据表(HTML) 5 Page - Micron Technology |
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5 / 86 page ![]() Datasheet Sept 2012 5 Order Number:208042-0 6 P30-65nm 1.0 Functional Description 1.1 Introduction This document provides information about the Numonyx® AxcellTM P30-65nm Flash memory and describes its features, operations, and specifications. P30-65nm is the latest generation of Numonyx® AxcellTM P30 Flash memory to the embedded flash market segment, offered in 64-Mbit up through 2-Gbit. This document covers specifically 512-Mbit, 1-Gbit and 2-Gbit product information. Benefits include more density in less space, high-speed interface on TSOP package, and support for code and data storage. Features include high-performance synchronous-burst read mode, a dramatical improvement in buffer program time through larger buffer size, fast asynchronous access times, low power, flexible security options, and two industry- standard package choices. P30-65nm is manufactured using Numonyx® 65nm process technology. 1.2 Overview P30-65nm device provides high performance on a 16-bit data bus. Individually erasable memory blocks are sized for optimum code and data storage. Upon initial power-up or return from reset, the device defaults to asynchronous page-mode read. Configuring the Read Configuration Register (RCR) enables synchronous burst-mode reads. In synchronous burst mode, output data is synchronized with a user-supplied clock signal. A WAIT signal provides easy CPU-to-flash memory synchronization. In addition to the enhanced architecture and interface, the device incorporates technology that enables fast buffer program and erase operations. The device features a 512-word buffer to enable optimum programming performance, which can improve system programming throughput time significantly to 1.46MByte/s. Designed for low-voltage systems, the P30-65nm device supports read operations with VCC at 1.8V, and erase and program operations with VPP at 1.8V or 9.0V. Buffered Enhanced Factory Programming provides the fastest flash array programming performance with VPP at 9.0V, which increases factory throughput. With VPP at 1.8V, VCC and VPP can be tied together for a simple, ultra low power design. In addition to voltage flexibility, a dedicated VPP connection provides complete data protection when VPP ≤ VPPLK. The Command User Interface is the interface between the system processor and all internal operations of the device. An internal Write State Machine automatically executes the algorithms and timings necessary for block erase and program. A Status Register indicates erase or program completion and any errors that may have occurred. A device command sequence invokes program and erase automation. Each erase operation erases one block. The Erase Suspend feature allows system software to pause an erase cycle to read or program data in another block. Program Suspend allows system software to pause programming to read other locations. P30-65nm OTP Register allows unique flash device identification that can be used to increase system security. The individual Block Lock feature provides zero-latency block locking and unlocking. The P30-65nm device adds enhanced protection via Password Access; this new feature allows write and/or read access protection of user-defined blocks. In addition, the P30-65nm device also has backward compatible One-Time Programmable (OTP) permanent block locking security feature. |
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