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AD8366ACPZ-R7 数据表(PDF) 22 Page - Analog Devices |
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AD8366ACPZ-R7 数据表(HTML) 22 Page - Analog Devices |
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22 / 28 page ![]() AD8366 Rev. A | Page 22 of 28 CHARACTERIZATION SETUPS Figure 58 and Figure 59 are characterization setups used extensively to characterize the AD8366. Characterization was done on single-ended and differential evaluation boards. The bulk of the characterization was done using an automated VEE program to control the equipment as shown in Figure 58. This setup was used to measure P1dB, OIP3, OIP2, IMD2, IMD3, harmonic distortion, gain, gain error, supply current, and noise density. All measurements were done with a 200 Ω load. All balun, output matching network, and filter losses were de-embedded. Gain error was measured with constant input power. All other measurements were done on 2 V p-p (4 dBm, re: 200 Ω) on the output of the device under test (DUT), and 2 V p-p composite output for two-tone measurements. To measure harmonic distortion, band-pass and band-reject filters were used on the input and output of the DUT. Figure 59 shows the setup used to make differential measurements. All measurements on this setup were done in a 50 Ω system and post processed to reference the measurements to a 200 Ω system. Gain and phase mismatch were measured with 2 V p-p on the output, and small signal frequency responses were measured with −30 dBm on the input of the DUT. |
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