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CD00001237 数据表(PDF) 66 Page - STMicroelectronics |
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CD00001237 数据表(HTML) 66 Page - STMicroelectronics |
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66 / 105 page ![]() ST6215C ST6225C 66/105 OPERATING CONDITIONS (Cont’d) 11.3.2 Operating Conditions with Low Voltage Detector (LVD) Subject to general operating conditions for VDD, fOSC, and TA. Notes: 1. LVD typical data are based on TA=25°C. They are given only as design guidelines and are not tested. 2. The minimum VDD rise time rate is needed to insure a correct device power-on and LVD reset. Not tested in production. 3. Data based on characterization results, not tested in production. Figure 39. LVD Threshold Versus VDD and fOSC 3) Figure 40. Typical LVD Thresholds Versus Temperature for OTP devices Figure 41. Typical LVD thresholds vs. Temperature for ROM devices Symbol Parameter Conditions Min Typ 1) Max Unit VIT+ Reset release threshold (VDD rise) 3.9 4.1 4.3 V VIT- Reset generation threshold (VDD fall) 3.6 3.8 4 Vhys LVD voltage threshold hysteresis VIT+-VIT- 50 300 700 mV VtPOR VDD rise time rate 2) mV/s tg(VDD) Filtered glitch delay on VDD 3) Not detected by the LVD 30 ns fOSC [MHz] SUPPLY 8 4 0 2.5 3 3.5 4 4.5 5 5.5 FUNCTIONAL AREA RESET FUNCTIONALITY NOT GUARANTEED IN THIS AREA VIT-≥3.6 DEVICE UNDER IN THIS AREA 6 VOLTAGE [V] -40°C 25°C 95°C 125°C T [°C] 3.6 3.8 4 4.2 Thresholds [V] Vdd up Vdd down VIT+ VIT- -40°C 25°C 95°C 125°C T [°C] 3.6 3.8 4 4.2 Thresholds [V] Vdd up Vdd down VIT+ VIT- 1 |
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