STM32F217VG datasheet(121/173 Pages) STMICROELECTRONICS

121 / 173 page

STM32F21xxx

Electrical characteristics

Doc ID 17050 Rev 8

121/173

Figure 52.

12-bit buffered /non-buffered DAC

The DAC integrates an output buffer that can be used to reduce the output impedance and to drive external loads directly

without the use of an external operational amplifier. The buffer can be bypassed by configuring the BOFFx bit in the

DAC_CR register.

5.3.22

Temperature sensor characteristics

5.3.23

VBAT monitoring characteristics

R LOAD

C LOAD

Buffered/Non-buffered DAC

DACx_OUT

Buffer(1)

12-bit

digital to

analog

converter

ai17157

Table 66.

TS characteristics

Symbol

Parameter

Min

Typ

Max

Unit

(1)

Based on characterization, not tested in production.

VSENSE linearity with temperature

±1

±2°C

Avg_Slope(1)

Average slope

2.5

mV/°C

V25

(1)

Voltage at 25 °C

0.76

tSTART

(2)

Guaranteed by design, not tested in production.

Startup time

µs

TS_temp

(3)(2)

Shortest sampling time can be determined in the application by multiple iterations.

ADC sampling time when reading the

temperature

1°C accuracy

µs

Table 67.

VBAT monitoring characteristics

Symbol

Parameter

Min

Typ

Max

Unit

Resistor bridge for VBAT

-50-

Ratio on VBAT measurement

Er(1)

Guaranteed by design, not tested in production.

Error on Q

–1

TS_vbat

(2)(2)

Shortest sampling time can be determined in the application by multiple iterations.

ADC sampling time when reading the VBAT

1mV accuracy

µs

STM32F217VG 数据表(PDF) 121 Page - STMicroelectronics

STM32F217VG 数据表(HTML) 121 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

数据表下载