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CLC030 数据表(PDF) 6 Page - National Semiconductor (TI) |
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CLC030 数据表(HTML) 6 Page - National Semiconductor (TI) |
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6 / 29 page ![]() DC Electrical Characteristics (Continued) Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Notes 2, 3). Symbol Parameter Conditions Reference Min Typ Max Units I DD (2.5V) Power Supply Current, 2.5V Supply, Total V CLK = 27 MHz, NTSC Colour Bar Pattern, Test Circuit, Test Loads Shall Apply V DDD,VDDZ, V DDPLL 66 85 mA I DD (2.5V) Power Supply Current, 2.5V Supply, Total V CLK = 74.25 MHz, NTSC Colour Bar Pattern, Test Circuit, Test Loads Shall Apply V DDD,VDDZ, V DDPLL 85 110 mA AC Electrical Characteristics Over Supply Voltage and Operating Temperature ranges, unless otherwise specified (Note 3). Symbol Parameter Conditions Reference Min Typ Max Units f VCLK Parallel Video Clock Frequency V CLK 27 74.25 MHz DC V Video Clock Duty Cycle V CLK 45 50 55 % f ACLK Ancilliary Clock Frequency A CLK V CLK MHz DC A Ancilliary Clock Duty Cycle A CLK 45 50 55 % t r,tf Input Clock and Data Rise Time, Fall Time 10%–90% V CLK,ACLK, DV N,ADN 1.0 1.5 3.0 ns BR SDO Serial Data Rate (Notes 5, 6) SDO, SDO 270 1,485 M bps t r,tf Rise Time, Fall Time 20%–80%, (Note 6) SDO, SDO 270 ps t r,tf Rise Time, Fall Time 20%–80%, (Note 5) SDO, SDO 500 ps Output Overshoot (Note 4) SDO, SDO 5% t j Serial Output Jitter, Intrinsic 270 M bps, (Notes 5, 9, 10) SDO, SDO 200 ps P-P t j Serial Output Jitter, Intrinsic 1,485 M bps, (Notes 6, 9, 10) SDO, SDO 120 ps P-P t LOCK Lock Time (Notes 5, 7) (SD Rates) 15 ms t LOCK Lock Time (Notes 6, 7) (HD Rates) 15 ms t S Setup Time, Video Data Timing Diagram, (Note 4) DV N to VCLK 1.5 2.0 ns t H Hold Time, Video Data Timing Diagram, (Note 4) V CLK to DVN 1.5 2.0 ns t S Setup Time, Anc. Data Port Timing Diagram, (Note 4) AD N to ACLK 1.5 2.0 ns t H Hold Time, Anc. Data Port Timing Diagram, (Note 4) A CLK to ADN 1.5 2.0 ns Note 1: “Absolute Maximum Ratings” are those parameter values beyond which the life and operation of the device cannot be guaranteed. The stating herein of these maximums shall not be construed to imply that the device can or should be operated at or beyond these values. The table of “Electrical Characteristics” specifies acceptable device operating conditions. Note 2: Current flow into device pins is defined as positive. Current flow out of device pins is defined as negative. All voltages are referenced to VSS =0V. Note 3: Typical values are stated for VDDIO =VDDSD = +3.3V, VDDD =VDDPLL = +2.5V and TA = +25˚C. Note 4: Spec. is guaranteed by design. Note 5: RL =75Ω, AC-coupled @ 270 Mbps,RREFLVL = RREFPRE = 4.75 kΩ 1%, See Test Loads and Test Circuit. Note 6: RL =75Ω, AC-coupled @ 1,485 Mbps,RREFLVL = RREFPRE = 4.75 kΩ 1%, See Test Loads and Test Circuit. Note 7: Measured from rising-edge of first DVCLK cycle until Lock Detect output goes high (true). Lock time includes format detection time plus PLL lock time. Note 8: Average value measured between rising edges computed over at least one video field. Note 9: Intrinsic timing jitter is measured in accordance with SMPTE RP 184-1996, SMPTE RP 192-1996 and the applicable serial data transmission standard, SMPTE 259M-1997 or SMPTE 292M (proposed). A colour bar test pattern is used. The value of fSCLK is 270 MHz or 360 MHz for SMPTE 259M, 540MHz for SMPTE 344M or 1,485 MHz for SMPTE 292M serial data rates. See Timing Jitter Bandpass section. www.national.com 6 |
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