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SLK2501IPZP 数据表(PDF) 11 Page - Texas Instruments |
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SLK2501IPZP 数据表(HTML) 11 Page - Texas Instruments |
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11 / 20 page ![]() SLK2501 OC48/24/12/3 SONET/SDH MULTIRATE TRANSCEIVER SLLS502A – OCTOBER 2001 – REVISED NOVEMBER 2001 11 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 detailed description (continued) signal detect The SLK2501 has an input SIGDET pin to force the device into the loss of signal state. This pin is generally connected to the signal detect output of the optical receiver. Depending on the optics manufacturer, this signal can be either active high or active low. To accommodate the differences, a polarity select (PS) is used. For an active low, SIGDET input sets the PS pin high. For an active high, SIGDET input sets the PS pin low. When the PS signal pin and SIGDET are of opposite polarities, the loss of signal state is generated and the device transmits all zeroes downstream. multiplexer operation The 4-bit parallel LVDS data is clocked into an input buffer by a clock derived from the synthesized clock. The data is then clocked into a 4:1 multiplexer. The D0 bit is the most significant bit and is shifted out first in the serial output stream. demultiplexer operation The serial 2.5 Gbps data is clocked into a 1:4 demultiplexer by the recovered clock. The D0 bit is the first bit that is received in time from the input serial stream. The 4-bit parallel data is then sent to the LVDS driver along with the divided down recovered clock. frame synchronization The SLK2501 has a SONET/SDH-compatible frame detection circuit that can be enabled or disabled by the user. Frame detection is enabled when the FRAMEN pin is high. When enabled it detects the A1, A2 framing pattern, which is used to locate and align the byte and frame boundaries of the incoming data stream. When FRAMEN is low the frame detection circuitry is disabled and the byte boundary is frozen to the location found when detection was previously enabled. The frame detect circuit searches the incoming data for three consecutive A1 bytes followed immediately by one A2 byte. The data alignment circuit then aligns the parallel output data to the byte and frame boundaries of the incoming data stream. During the framing process the parallel data bus will not contain valid and aligned data. Upon detecting the third A1, A2 framing patterns that are separated by 125 µs from each other, the FSYNC signal goes high for four RXCLK cycles, indicating frame synchronization has been achieved. The probability that random data in a SONET/SDH data stream will mimic the framing pattern in the data payload is extremely low. However, there is a state machine built in to prevent false reframing if a framing pattern does show up in the data payload. testability The SLK2501 has a comprehensive suite of built-in self-tests. The Loopback function provides for at-speed testing of the transmit/receive portions of the circuitry. The enable pin allows for all circuitry to be disabled so that an Iddq test can be performed. The PRBS function allows for a BIST (built-in self-test). IDDQ function When held low, the ENABLE pin disables all quiescent power in both the analog and digital circuitry. This allows for Iddq testing on all power supplies and can also be used to conserve power when the link is inactive. local loopback The LLOOP signal pin controls the local loopback. When LLOOP is high, the loopback mode is activated and the parallel transmit data is selected and presented on the parallel receive data output pins. The parallel transmit data is also multiplexed and presented on the high-speed serial transmit pins. Local Loopback can only be enabled when the device is under transceiver mode. |
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