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PCK12429BD 数据表(PDF) 10 Page - NXP Semiconductors |
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PCK12429BD 数据表(HTML) 10 Page - NXP Semiconductors |
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10 / 14 page ![]() Philips Semiconductors Product data PCK12429 25–400 MHz differential PECL clock generator 2002 Jun 03 10 Jitter performance of the PCK12429 The PCK12429 exhibits long term and cycle-to-cycle jitter which rivals that of SAW based oscillators. This jitter performance comes with the added flexibility one gets with a synthesizer over a fixed frequency oscillator. 0 5 10 15 20 200 220 240 260 280 300 320 340 360 380 400 VCO FREQUENCY (MHz) N = 1 N = 2 N = 4 N = 8 SW01010 Figure 5. RMS PLL jitter versus VCO frequency Figure 5 illustrates the RMS jitter performance of the PCK12429 across its specified VCO frequency range. Note that the jitter is a function of both the output frequency as well as the VCO frequency, however the VCO frequency shows a much stronger dependence. The data presented has not been compensated for trigger jitter, this fact provides a measure of guardband to the reported data. In addition the data represents long term period jitter, the cycle-to-cycle jitter could not be measured to the level of accuracy required with available test equipment but certainly will be smaller than the long term period jitter. The most commonly specified jitter parameter is cycle-to-cycle jitter. Unfortunately with today’s high performance measurement equipment there is no way to measure this parameter for jitter performance in the class demonstrated by the PCK12429. As a result, different methods are used which approximate cycle-to-cycle jitter. The typical method of measuring the jitter is to accumulate a large number of cycles, create a histogram of the edge placements, and record peak-to-peak as well as standard deviations of the jitter. Care must be taken that the measured edge is the edge immediately following the trigger edge. The oscilloscope cannot collect adjacent pulses, rather it collects pulses from a very large sample of pulses. It is safe to assume that collecting pulse information in this mode will produce period jitter values somewhat larger than if consecutive cycles (cycle-to-cycle jitter) were measured. All of the jitter data reported on the PCK12429 was collected in this manner. Figure 6 shows the jitter as a function of the output frequency. For the PCK12429, this information is probably of more importance. The flat line represents an RMS jitter value that corresponds to an 8 sigma ±25 ps peak-to-peak long term period jitter. The graph shows that for output frequencies from 125 to 400 MHz the jitter falls within the ±25 ps peak-to-peak specification. The general trend is that as the output frequency is decreased the output edge jitter will increase. 0.00 5.00 10.00 15.00 20.00 25.00 25 50 75 100 125 150 175 200 225 250 275 300 325 350 375 400 OUTPUT FREQUENCY (MHz) 6.25 ps REFERENCE (1 SIGMA) SW01011 Figure 6. RMS jitter versus output frequency The jitter data presented should provide users with enough information to determine the effect on their overall timing budget. The jitter performance meets the needs of most system designs while adding the flexibility of frequency margining and field upgrades. These features are not available with a fixed frequency SAW oscillator. |
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