AM29F016 datasheet(25/36 Pages) AMD

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Am29F016

AC CHARACTERISTICS

Read-only Operations Characteristics

Notes:

1. Test Conditions (for -75):

Output Load: 1 TTL gate and 30 pF

Input rise and fall times: 5 ns

Input pulse levels: 0.0 V to 3.0 V

Timing measurement reference level: 1.5 V input and

output

2. Test Conditions (for all others):

Output Load: 1 TTL gate and 100 pF

Input rise and fall times: 20 ns

Input pulse levels: 0.45 V to 2.4 V

Timing measurement reference level: 0.8 V and 2.0 V

input and output

3. Output driver disable time.

4. Not 100% tested.

Parameter Symbol

Parameter Description

Test Setup

Speed Options (Notes 1 and 2)

Unit

JEDEC

Standard

-75

-90

-120

-150

tAVAV

tRC

Read Cycle Time 4

Min

120

150

tAVQV

tACC

Address to Output Delay

CE = VIL

OE = VIL

Max

120

150

tELQV

tCE

Chip Enable to Output Delay

OE = VIL Max

120

150

tGLQV

tOE

Output Enable to Output Delay

Max

tEHQZ

tDF

Chip Enable to Output High Z

(Notes 3, 4)

Max

20203035

tGHQZ

tDF

Output Enable to Output High Z

(Notes 3, 4)

Max

20203035

tAXQX

tOH

Output Hold Time From Addresses CE

or OE Whichever Occurs First

Min

0000

tReady

RESET Pin Low to Read Mode

Max

20202020

µs

18805D-11

Figure 7.

Test Conditions

2.7 k

Ω

Diodes = IN3064

or Equivalent

6.2 k

Ω

5.0 Volt

IN3064

or Equivalent

Note:

CL (for -75) = 30 pF including jig capacitance

CL (for all others) = 100 pF including jig capacitance

Device

Under

Test

AM29F016 数据表(PDF) 25 Page - Advanced Micro Devices

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