DS3153N datasheet(34/60 Pages) DALLAS

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DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs

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Shift-DR. The test data register selected by the current instruction is connected between JTDI and JTDO and shifts

data one stage toward its serial output on each rising edge of JTCLK. If a test register selected by the current

instruction is not placed in the serial path, it maintains its previous state.

Exit1-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state,

which terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Pause-DR

state.

Pause-DR. Shifting of the test registers is halted while in this state. All test registers selected by the current

instruction retain their previous state. The controller remains in this state while JTMS is low. A rising edge on

JTCLK with JTMS high puts the controller in the Exit2-DR state.

Exit2-DR. While in this state, a rising edge on JTCLK with JTMS high puts the controller in the Update-DR state

and terminates the scanning process. A rising edge on JTCLK with JTMS low puts the controller in the Shift-DR

state.

Update-DR. A falling edge on JTCLK while in the Update-DR state latches the data from the shift register path of

the test registers into the data output latches. This prevents changes at the parallel output because of changes in

the shift register. A rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS

high, the controller enters the Select-DR-Scan state.

Select-IR-Scan. All test registers retain their previous state. The instruction register remains unchanged during this

state. With JTMS low, a rising edge on JTCLK moves the controller into the Capture-IR state and initiates a scan

sequence for the instruction register. JTMS high during a rising edge on JTCLK puts the controller back into the

Test-Logic-Reset state.

Capture-IR. The Capture-IR state is used to load the shift register in the instruction register with a fixed value. This

value is loaded on the rising edge of JTCLK. If JTMS is high on the rising edge of JTCLK, the controller enters the

Exit1-IR state. If JTMS is low on the rising edge of JTCLK, the controller enters the Shift-IR state.

Shift-IR. In this state, the instruction register’s shift register is connected between JTDI and JTDO and shifts data

one stage for every rising edge of JTCLK toward the serial output. The parallel register and the test registers

remain at their previous states. A rising edge on JTCLK with JTMS high moves the controller to the Exit1-IR state.

A rising edge on JTCLK with JTMS low keeps the controller in the Shift-IR state, while moving data one stage

through the instruction shift register.

Exit1-IR. A rising edge on JTCLK with JTMS low puts the controller in the Pause-IR state. If JTMS is high on the

rising edge of JTCLK, the controller enters the Update-IR state and terminates the scanning process.

Pause-IR. Shifting of the instruction register is halted temporarily. With JTMS high, a rising edge on JTCLK puts

the controller in the Exit2-IR state. The controller remains in the Pause-IR state if JTMS is low during a rising edge

on JTCLK.

Exit2-IR. A rising edge on JTCLK with JTMS high puts the controller in the Update-IR state. The controller loops

back to the Shift-IR state if JTMS is low during a rising edge of JTCLK in this state.

Update-IR. The instruction shifted into the instruction shift register is latched into the parallel output on the falling

edge of JTCLK as the controller enters this state. Once latched, this instruction becomes the current instruction. A

rising edge on JTCLK with JTMS low puts the controller in the Run-Test-Idle state. With JTMS high, the controller

enters the Select-DR-Scan state.

DS3153N 数据表(PDF) 34 Page - Dallas Semiconductor

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