DS3153N datasheet(36/60 Pages) DALLAS

部件名	DS3153N

功能描述	Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs

PDF	60 Pages

Scroll/Zoom	100%

制造商	DALLAS [Dallas Semiconductor]

网页	https://www.maximintegrated.com/en.html

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36 / 60 page

DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs

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12.4 JTAG Test Registers

IEEE 1149.1 requires a minimum of two test registers—the bypass register and the boundary scan register. An

optional test register, the identification register, has been included in the device design. It is used with the IDCODE

instruction and the Test-Logic-Reset state of the TAP controller.

Bypass Register. This single 1-bit shift register, used with the BYPASS, CLAMP, and HIGHZ instructions,

provides a short path between JTDI and JTDO.

Boundary Scan Register. This register contains a shift register path and a latched parallel output for control cells

and digital I/O cells. DS315x BSDL files are available at www.maxim-ic.com/TechSupport/telecom/bsdl.htm.

Identification Register. This register contains a 32-bit shift register and a 32-bit latched parallel output. It is

selected during the IDCODE instruction and when the TAP controller is in the Test-Logic-Reset state.

DS3153N 数据表(PDF) 36 Page - Dallas Semiconductor