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DS3153N 数据表(PDF) 40 Page - Dallas Semiconductor |
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DS3153N 数据表(HTML) 40 Page - Dallas Semiconductor |
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40 / 60 page ![]() DS3151/DS3152/DS3153/DS3154 Single/Dual/Triple/Quad DS3/E3/STS-1 LIUs 40 of 60 Table 13-F. Transmitter Output Characteristics—DS3 and STS-1 Modes (VDD = 3.3V ±5%, TA = -40°C to +85°C.) PARAMETER MIN TYP MAX UNITS DS3 Output Pulse Amplitude, TLBO = 0 (Note 17) 700 800 900 mVpk DS3 Output Pulse Amplitude, TLBO = 1 (Note 17) 520 700 800 mVpk STS-1 Output Pulse Amplitude, TLBO = 0 (Note 17) 700 800 1100 mVpk STS-1 Output Pulse Amplitude, TLBO = 1 (Note 17) 520 700 850 mVpk Ratio of Positive and Negative Pulse-Peak Amplitudes 0.9 1.1 DS3 Unframed All-Ones Power Level at 22.368MHz, 3kHz Bandwidth -1.8 +5.7 dBm DS3 Unframed All-Ones Power Level at 44.736MHz vs. Power Level at 22.368MHz, 3kHz Bandwidth -20 dB Intrinsic Jitter Generation (Note 18) 0.02 0.05 UIP-P Table 13-G. Transmitter Output Characteristics—E3 Mode (VDD = 3.3V ±5%, TA = -40°C to +85°C.) PARAMETER MIN TYP MAX UNITS Output Pulse Amplitude (Note 17) 900 1000 1100 mVpk Pulse Width 14.55 ns Ratio of Positive and Negative Pulse Amplitudes (at Centers of Pulses) 0.95 1.05 Ratio of Positive and Negative Pulse Widths (at Nominal Half Amplitude) 0.95 1.05 Intrinsic Jitter Generation (Note 18) 0.02 0.05 UIP-P Note 17: Measured on the line side (i.e., the BNC connector side) of the 2:1 transmit transformer (Figure 1-1). Note 18: Measured with jitter-free clock applied to TCLK and a bandpass jitter filter with 10Hz and 800kHz cutoff frequencies. Not tested during production test. Table 13-H. CPU Bus Timing (VDD = 3.3V ±5%, TA = -40°C to +85°C.) (Figure 13-3 and Figure 13-4) PARAMETER SYMBOL MIN TYP MAX UNITS Setup Time for A[5:0] Valid to CS Active (Notes 19, 20) t1 0 ns Setup Time for CS Active to RD, WR, or DS Active t2 0 ns Delay Time from RD or DS Active to D[7:0] Valid t3 65 ns Hold Time from RD or WR or DS Inactive to CS Inactive t4 0 ns Delay from CS or RD or DS Inactive to D[7:0] Invalid or Tri-State (Note 21) t5 2 20 ns Wait Time from WR or DS Active to Latch D[7:0] t6 65 ns D[7:0] Setup Time to WR or DS Inactive t7 10 ns D[7:0] Hold Time from WR or DS Inactive t8 2 ns A[5:0] Hold Time from WR or RD or DS Inactive t9 5 ns RD, WR, or DS Inactive Time t10 75 ns Muxed Address Valid to ALE Falling (Note 22) t11 10 ns Muxed Address Hold Time (Note 22) t12 10 ns ALE Pulse Width (Note 22) t13 30 ns Setup Time for ALE High or Muxed Address Valid to CS Active (Note 22) t14 0 ns Note 19: D[7:0] loaded with 50pF when tested as outputs. Note 20: If a gapped clock is applied on TCLK and diagnostic loopback is enabled, read cycle time must be extended by the length of the largest TCLK gap. Note 21: Not tested during production test. Note 22: In nonmultiplexed bus applications (Figure 13-3), ALE should be wired high. In multiplexed bus applications (Figure 13-4), A[5:0] should be wired to D[5:0] and the falling edge of ALE latches the address. |
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