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PWD13F60 数据表(PDF) 10 Page - STMicroelectronics |
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PWD13F60 数据表(HTML) 10 Page - STMicroelectronics |
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10 / 26 page ![]() Device characterization values PWD13F60 10/26 DocID030865 Rev 2 5 Device characterization values Table 7, Table 8 and electrical characteristics curves (from Figure 4 to Figure 12) contained in this section represent typical values based on characterization and simulation results. Table 7. Power MOSFET Symbol Parameter Test condition Min. Typ. Max. Unit MOSFET dynamic Qg Total gate charge VGS = 10 V, TJ = 25 °C VDS = 480 V, ID = 3 A -26 - nC Source-drain diode trr Diode reverse recovery time ISD = 3 A, VS = 100 V, di/dt = 100 A/µs, TJ = 25 °C -93 - ns Qrr Diode reverse recovery charge - 376 - nC IRRM Diode reverse recovery current - 8.1 - A Table 8. Inductive load switching characteristics Symbol Parameter Test condition Min. Typ. Max. Unit t(on)(1) Turn-on time VS = 300 V, VCC = VBO = 15 V, IOUT = 3 A, TJ = 25 °C, see Figure 3 -280 - ns tC(on)(2) Crossover time (on) - 75 - ns t(off)(1) Turn-off time - 360 - ns tC(off)(2) Crossover time (off) - 105 - ns Eon Turn-on switching losses - 115 - µJ Eoff Turn-off switching losses - 35 - µJ DT Suggested minimum dead time - - 270 ns 1. t(on) and t(off) include the propagation delay time of the internal driver. 2. tC(on) and tC(off) are the switching times of the MOSFET itself under the internally given gate driving conditions. |
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