ADGM1004JCPZ-R2 datasheet(29/32 Pages) AD

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Data Sheet

ADGM1004

Rev. D | Page 29 of 32

Figure 58 and Figure 59 illustrate typical cascaded switch use cases

and the corresponding schemes to mitigate floating node risks.

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ADGM1004

RF1

RF2

RF3

RF4

RF1

RF2

RF3

RF4

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Figure 58. Two ADGM1004 Devices Connected in Path Selection

Configuration with 10 M

Ω Shunt Resistors to Mitigate Floating Nodes

ADGM1004

RF1

RF2

RF3

RF4

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RF1

RF2

RF3

RF4

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RF1

RF2

RF3

RF4

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Figure 59. Three ADGM1004 Devices Connected in Fanout Configuration

with 10 M

Ω Shunt Resistors to Mitigate Floating Nodes

Avoid connecting shunt capacitors directly to the switch. A

capacitor can store a charge and potentially lead to hot switching

events when the switch opens or closes if there are no alternative

discharge paths. These events affect the cycle lifetime of the switch.

CUMULATIVE ON SWITCH LIFETIME

Leaving the switch in an on state for a long period affects the

lifetime of the switch because of mechanical degradation effects.

These effects can result in the switch failing to turn off. Figure 60

shows a failure rate at 50°C where the mean time to failure is

7.2 years (2628 days), resulting in 50% of the sample lot failing

at this point.

Temperatures above 50°C further reduce the switch lifetime.

The cumulative on switch lifetime specification is also duty cycle

dependent. If the user operates the MEMS switch with a duty

cycle of less than 50% the lifetime of the MEMS switch improves.

100

1,000

CONTINUOUSLY ON TIME (DAYS)

10,000

100,000

VDD = 3.3V

Figure 60. Cumulative On Switch Lifetime at 50°C, VDD = 3.3 V,

Sample Size 31 Parts

HANDLING PRECAUTIONS

Electrical Overstress (EOS) Precautions

The ADGM1004 is susceptible to EOS. Therefore, take the

following precautions:



The ADGM1004 is an ESD sensitive device. Ensure to take

all of the normal handling precautions, including working

only on static dissipative surfaces, wearing wrist straps or

other ESD control devices, and storing unused devices in

conductive foam.



Avoid running measurement instruments, such as digital

multimeters (DMMs), in autorange modes. Some

instruments generate large transient compliance voltages

when switching between ranges.



Use the highest practical DMM range setting (the lowest

resolution) for resistance measurements to minimize

compliance voltages, particularly during switching.



Discharge coaxial cables before connecting directly to the

switch. Note that coaxial cables can store charge and lead

to EOS when directly connected to the switch.



Avoid connecting large capacitive terminations directly to

the switch, as shown in Figure 61. A shunt capacitor can

store a charge that potentially leads to hot switching events

when the switch opens or closes, affecting the lifetime of

the switch.

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Figure 61. Avoid Having a Large Capacitor Directly Connected to the

MEMS Switch

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