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PPC5606BAVLL6R 数据表(PDF) 60 Page - NXP Semiconductors |
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PPC5606BAVLL6R 数据表(HTML) 60 Page - NXP Semiconductors |
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60 / 114 page ![]() MPC5607B Microcontroller Data Sheet, Rev. 10 Electrical characteristics NXP Semiconductors 60 • POR monitors VDD during the power-up phase to ensure device is maintained in a safe reset state (refer to RGM Destructive Event Status (RGM_DES) Register flag F_POR in device reference manual) • LVDHV3 monitors VDD to ensure device reset below minimum functional supply (refer to RGM Destructive Event Status (RGM_DES) Register flag F_LVD27 in device reference manual) • LVDHV3B monitors VDD_BV to ensure device reset below minimum functional supply (refer to RGM Destructive Event Status (RGM_DES) Register flag F_LVD27_VREG in device reference manual) • LVDHV5 monitors VDD when application uses device in the 5.0 V ± 10% range (refer to RGM Functional Event Status (RGM_FES) Register flag F_LVD45 in device reference manual) • LVDLVCOR monitors power domain No. 1 (refer to RGM Destructive Event Status (RGM_DES) Register flag F_LVD12_PD1 in device reference manual) • LVDLVBKP monitors power domain No. 0 (refer to RGM Destructive Event Status (RGM_DES) Register flag F_LVD12_PD0 in device reference manual) NOTE When enabled, power domain No. 2 is monitored through LVDLVBKP. Figure 10. Low voltage detector vs reset VDD VLVDHVxH RESET VLVDHVxL |
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