PPC5606BAVLL6R datasheet(64/114 Pages) NXP

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MPC5607B Microcontroller Data Sheet, Rev. 10

Electrical characteristics

NXP Semiconductors

ECC circuitry provides correction of single bit faults and is used to improve further automotive reliability

results. Some units will experience single bit corrections throughout the life of the product with no impact

to product reliability.

4.9.2

Flash power supply DC characteristics

Table 31 shows the power supply DC characteristics on external supply.

Table 29. Flash module life

Symbol

Parameter

Conditions

Value

Unit

Min

Typ

Max

P/E

CC C Number of program/erase

cycles per block for 16 KB

blocks over the operating

temperature range (TJ)

—

100,000

—

cycles

P/E

CC C Number of program/erase

cycles per block for 32 KB

blocks over the operating

temperature range (TJ)

—

10,000

100,000

—

cycles

P/E

CC C Number of program/erase

cycles per block for 128 KB

blocks over the operating

temperature range (TJ)

—

1,000

100,000

—

cycles

Retention

CC C Minimum data retention at

85 °C average ambient

temperature1

1 Ambient temperature averaged over duration of application, not to exceed recommended product operating

temperature range.

Blocks with

0–1,000 P/E cycles

—

years

Blocks with

1,001–10,000 P/E

cycles

—

years

Blocks with

10,001–100,000 P/E

cycles

5—

—

years

Table 30. Flash read access timing

Symbol

Parameter

Conditions1

1 V

DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = −40 to 125 °C, unless otherwise specified

Max

Unit

fREAD

P Maximum frequency for Flash reading

2 wait states

MHz

1 wait state

0 wait states

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