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SPSB0813 数据表(PDF) 76 Page - STMicroelectronics

部件名 SPSB0813
功能描述  Automotive power management IC with LIN and CAN-FD
PDF  135 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

SPSB0813 数据表(HTML) 76 Page - STMicroelectronics

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background image
Symbol
Parameter
Condition
Min
Typ
Max
Unit
Item
fCLK
SPI input frequency
at CLK
Tested by scan
10
MHz
B.012
1. Value of input capacity is not measured in production test. Parameter guaranteed by design.
Table 57. DI, CLK and CSN timing
Symbol
Parameter
Condition
Min
Typ
Max
Unit
Item
tCLK
clock period
V1 = 5 V; tested
by scan
100
ns
B.013
tCLKH
clock high time
V1 = 5 V
40
ns
B.014
tCLKL
clock low time
V1 = 5 V
40
ns
B.015
tset CSN
CSN setup time, CSN
low before rising edge
of CLK
V1 = 5 V
150
ns
B.016
tset CLK
CLK setup time, CLK
high before rising edge
of CSN
V1 = 5 V
150
ns
B.017
tset DI
DI setup time
V1 = 5 V
25
ns
B.018
thold DI
DI hold time
V1 = 5 V
25
ns
B.019
tr in
rise time of input signal
DI, CLK, CSN
V1 = 5 V(1)
25
ns
B.020
tf in
fall time of input signal
DI, CLK, CSN
V1 = 5 V (1)
25
ns
B.021
1. Guaranteed by design.
Table 58. Output: DO
Symbol
Parameter
Condition
Min
Typ
Max
Unit
Item
VDOL
output low level
V1 = 5 V, IDO = -4mA
0.5
V
B.022
VDOH
output high level
V1 = 5 V, IDO = 4 mA
V1-0.5
V
B.023
IDOLK
tristate leakage
current
VCSN = V1, 0V < VDO
<´V1
-10
10
μA
B.024
CDO (1)
tristate input
capacitance
VCSN = V1,
0 V < V1 < 5.3 V
10
15
pF
B.025
1. Guaranteed by design.
Table 59. DO timing
Symbol
Parameter
Condition
Min
Typ
Max
Unit
Item
tr DO
DO rise time
CL = 50 pF, Iload = -1
mA
25
ns
B.026
tf DO (1)
DO fall time
CL = 50 pF, Iload = 1
mA
25
ns
B.027
ten DO tri L(1)
DO enable time
from tristate to low
level
CL = 50 pF, Iload = 1
mA
pull-up load to V1
50
100
ns
B.028
SPSB081
SPI
DS14048 - Rev 1
page 76/135



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