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STP60N043DM9 数据表(PDF) 7 Page - STMicroelectronics |
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STP60N043DM9 数据表(HTML) 7 Page - STMicroelectronics |
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7 / 12 page ![]() 3 Test circuits Figure 13. Unclamped inductive load test circuit AM01471v1 VD ID D.U.T. L VDD + pulse width Vi 3.3 µF 2200 µF Figure 14. Unclamped inductive waveform AM01472v1 V(BR)DSS VDD VDD VD IDM ID Figure 15. Test circuit for gate charge behavior AM01469v10 47 kΩ 2.7 kΩ 1 kΩ I G= CONST 100 Ω D.U.T. + pulse width VGS 2200 μF VG VDD RL Figure 16. Test circuit for inductive load switching and diode recovery times AM01470v1 A D D.U.T. S B G 25 Ω A A B B RG G D S 100 µH µF 3.3 1000 µF VDD D.U.T. + _ + fast diode Figure 17. Turn-off switching time waveform on inductive load AM05540v3 VGS VDS VDS ID ID 90%ID 10%ID 90%VDS 10%VDS 90%VGS tf(i) tr(v) tc(off) td(v) Figure 18. Turn-on switching time waveform on inductive load GADG241120211046SWTW 90%VDS 10%VDS 90%ID 10%ID 10%VGS 90%VGS ID VDS ID VDS tc(on) td(i) tf(v) tr(i) STP60N043DM9 Test circuits DS13931 - Rev 2 page 7/12 |
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