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ADF4377 数据表(PDF) 42 Page - Analog Devices |
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ADF4377 数据表(HTML) 42 Page - Analog Devices |
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42 / 79 page ![]() Data Sheet ADF4377 APPLICATIONS INFORMATION analog.com Rev. 0 | 42 of 79 Design Considerations The Reference and SYSREF Distribution Selection section, Board Layout Considerations section, Skew Adjustment Options section, Skew Measurement, Adjustments and System Error section, and Power-Up, Programming, and Measurement Sequence section pro- vide an overview of several design considerations when designing a low clock skew system with multiple ADF4377 devices and multiple JESD204B/C converters that include a TDC. Reference and SYSREF Distribution Selection In high performance applications that require minimum clock skew and drift, it is recommended to choose a reference distribution de- vice whose additive noise floor meets the requirements described in the Reference Source Considerations section, and whose output slew rate allows for the DMA option of the ADF4377 reference input buffer (see Table 7). The DMA option minimizes tPD-TC, as shown in Figure 20. Most reference distribution ICs output a square wave. The slew rate of a square wave is determined by Equation 25. ������������������������������������������������= ������������-������× %������������������������������������������������������������������ℎ������������������ℎ������������������−%������������������������������������������������������������������ℎ������������������ℎ������������������ ������������������������������ (25) The HMC7044, HMC7043, LTC6952, LTC6953, LTC6955, LTC6954, or LTC6957-1 are adequate reference distribution ICs for the noise floor and rise time requirements. By using multiple outputs from a single reference and SYSREF distribution IC, the reference and SYSREF temperature delay drift match. See the LTC6952, LTC6953, and LTC6957-1 data sheets for more information on output skew variation over process per output to aid in SYSREF output selection. Choosing the outputs with the least skew for SYSREF outputs improves the skew adjustment errors, as described in the Skew Measurement, Adjustments and System Error section. Selecting a JESD204B/C reference and SYSREF distribution IC requires knowledge of the AD9213 JESD204B serial lane rates and the clock and SYSREF requirements of the field programmable gate array (FPGA). Both these topics are beyond the scope of this data sheet. However, ADI has created several JESD204B/C devel- opment platforms that provide hardware and software examples that can aid further in the reference and SYSREF distribution IC selection. Several of these platforms are available on the Analog Devices website. Board Layout Considerations During hardware design, it is best to match the electrical lengths (ℓ) for the reference, clock, and SYSREF traces in Figure 92, as shown in Table 40. Table 40. Trace Length Matching for Skew Optimization If Skew Adjustments Performed Skew Optimization Skew Temperature Coef- ficient Optimization No ℓREFA = ℓREFB, ℓCLKA = ℓCLKB, and ℓSYSREFA = ℓSYSREFB ℓSYSREFx = ℓREFx + ℓCLKx Yes ℓSYSREFA = ℓSYSREFB ℓSYSREFx = ℓREFx + ℓCLKx Refer to the Analog Dialogue article, "Clock Skew in Large Multi- GHz Clock Trees" (Volume 53, January 2019) for more information on PCB material selection, transmission line selection, cable selec- tion, and several other concerns related to clock skew. Signal attenuation is proportional to the length of the trace and signal frequency. Converter clock traces must be treated as RF traces because any unwanted spurious or noise that couples onto the clock signals can affect the performance of the converters. Therefore, it is recommended to minimize the ℓCLKA and ℓCLKB trace lengths to optimize performance and limit attenuation. Refer to the ADC Clock and Jitter Considerations section for additional informa- tion on clock performance concerns, routing, and recommended schematics. In most cases, trace matching board layout errors can be corrected with the ∆t functions in the reference and SYSREF distribution IC, the ADF4377 or the AD9213, shown in Figure 92. Skew Adjustment Options Figure 92 has skew adjustment (∆t) blocks in the Stage 1 IC, the ADF4377, and the AD9213. In most cases, the ADF4377 is the pre- ferred skew adjustment option in terms of maximizing performance. The ADF4377 ∆t blocks are discussed in Table 37. For this design example, either R_DEL and N_DEL or BLEED_I bit fields, Bits[9:0] are valid options. However, in Figure 92, only R_DEL and N_DEL are shown. The AD9213 also provides a ∆t block capable of sub-ps step sizes. Like any ∆t block, there is an opportunity for increased phase noise. The ADF4377 and AD9213 ∆t blocks affect phase noise at different frequency offsets, as shown in Table 41. Table 41. Clock Phase Noise Region Affected by ADF4377 and AD9213 Δt Blocks Δt Block In-Band Phase Noise Wideband Phase Noise < ADF4377 Loop Filter Bandwidth ~10 MHz to fCLK ADF4377 ∆t Minimal additive noise, refer to Table 38 None AD9213 ∆t None Minimal additive noise The reference and SYSREF distribution IC in Figure 92 has a ∆t block for each output. The typical Stage 1 IC skew adjustment step size is in the 11 ps (LTC6952, LTC6953) to 25 ps (HMC7044, HMC7043) range. These ∆t blocks typically increase the phase |
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