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STM32G0C1NET7 数据表(PDF) 93 Page - STMicroelectronics |
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STM32G0C1NET7 数据表(HTML) 93 Page - STMicroelectronics |
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93 / 159 page  DS13564 Rev 4 93/159 STM32G0C1xC/xE Electrical characteristics 124 5.3.12 Electrical sensitivity characteristics Based on three different tests (ESD, LU) using specific measurement methods, the device is stressed in order to determine its performance in terms of electrical sensitivity. Electrostatic discharge (ESD) Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according to each pin combination. The sample size depends on the number of supply pins in the device (3 parts × (n+1) supply pins). This test conforms to the ANSI/JEDEC standard. Static latch-up Two complementary static tests are required on six parts to assess the latch-up performance: • A supply overvoltage is applied to each power supply pin. • A current is injected to each input, output and configurable I/O pin. These tests are compliant with EIA/JESD 78A IC latch-up standard. Table 51. EMI characteristics Symbol Parameter Conditions Monitored frequency band Max vs. [fHSE/fHCLK] Unit 8 MHz / 64 MHz SEMI Peak level VDD = 3.6 V, TA = 25 °C, LQFP100 package compliant with IEC 61967-2 0.1 MHz to 30 MHz 9 dBµV 30 MHz to 130 MHz 16 130 MHz to 1 GHz 4 1 GHz to 2 GHz 8 EMI level 2.5 - Table 52. ESD absolute maximum ratings Symbol Ratings Conditions Class Maximum value(1) Unit VESD(HBM) Electrostatic discharge voltage (human body model) TA = +25 °C, conforming to ANSI/ESDA/JEDEC JS-001 2 2000 V VESD(CDM) Electrostatic discharge voltage (charge device model) TA = +25 °C, conforming to ANSI/ESDA/JEDEC JS-002 C2a 250 1. Based on characterization results, not tested in production. Table 53. Electrical sensitivity Symbol Parameter Conditions Class LU Static latch-up class TA = +125 °C conforming to JESD78 II Level A |
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