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S29CD032J 数据表(PDF) 52 Page - SPANSION |
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S29CD032J 数据表(HTML) 52 Page - SPANSION |
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52 / 76 page ![]() 50 S29CD-J & S29CL-J Flash Family S29CD-J_CL-J_00_B1 September 27, 2006 Data Sheet (Pre limin ar y) 16. Test Conditions Figure 16.1 Test Setup Note Diodes are IN3064 or equivalent 17. Test Specifications Table 17.2 Key to Switching Waveforms 17.1 Switching Waveforms Figure 17.1 Input Waveforms and Measurement Levels CL Device Under Test Table 17.1 Test Specifications Test Condition 54D, 64C 65A, 75E Unit Output Load 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 30 100 pF Input Rise and Fall Times 5 ns Input Pulse Levels 0.0 V – VIO V Input timing measurement reference levels VIO/2 V Output timing measurement reference levels VIO/2 V Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) VIO VSS VIO/2 V VIO/2 V Output Measurement Level Input |
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