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ams Datasheet

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[v1-00] 2016-Apr-05

TSL2580, TSL2581 − Electrical Characteristics

Note(s):

1. Optical measurements are made using small-angle incident radiation from light-emitting diode optical sources. Visible 640 nm LEDs

and infrared 850 nm LEDs are used for final product testing for compatibility with high-volume production.

2. The 625 nm irradiance Ee is supplied by an AlInGaP light-emitting diode with the following characteristics: peak wavelength λp =

625 nm and spectral halfwidth

Δλ½ = 20 nm.

3. The 850 nm irradiance Ee is supplied by a light-emitting diode with the following characteristics: peak wavelength

λp = 850 nm and spectral halfwidth Δλ½ = 42 nm.

4. The integration time Tint, is dependent on internal oscillator frequency (fosc) and on the number of integration cycles (ITIME) in the

Timing Register (0xFF) as described in the Register section. For nominal fosc = 750 kHz, nominal Tint = 2.7 ms

× ITIME.

Full scale ADC

count value

ITIME = 0xDB (100 ms)

CH0

37887

counts

CH1

37887

ITIME = 0x6C (400 ms)

CH0

65535

CH1

65535

ADC count value

λp = 625 nm, ITIME = 0xF6 (27 ms),

Ee = 171.6 μW/cm

2, gain = 16x

CH0

4000

5000

6000

counts

CH1

700

λp = 850 nm, ITIME = 0xF6 (27 ms),

Ee = 220 μW/cm

2, gain = 16x

CH0

4000

5000

6000

CH1

2750

ADC count value

ratio: CH1/CH0

λp = 625 nm

10.8

15.8

20.8

%

λp = 850 nm

41

55

68

Irradiance

responsivity Re

λp = 625 nm, ITIME = 0xF6 (27 ms)

CH0

29.1

counts/

(

μW/cm2)

CH1

4

λp = 850 nm, ITIME = 0xF6 (27 ms)

CH0

22.8

CH1

12.5

Gain scaling

(relative to 1x)

8x

CH0

7

8

9

x

CH1

7

8

9

16x

CH0

15

16

17

CH1

15

16

17

111x

CH0

97

107

115

CH1

100

115

125

Parameter

Test Conditions

Channel

Min

Typ

Max

Unit