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TNETE2101 数据表(PDF) 36 Page - Texas Instruments |
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TNETE2101 数据表(HTML) 36 Page - Texas Instruments |
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36 / 39 page ![]() TNETE2101 10BASE-T/100BASE-TX/100BASE-FX LOW-POWER PHYSICAL-LAYER INTERFACE SPWS032D – JANUARY 1997 – REVISED MARCH 1999 36 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 receiver squelch parameters 10BASE-T PARAMETER DESCRIPTION MIN TYP MAX UNIT Vthp Positive-squelch receiver threshold voltage 250 mV Vthn Negative-squelch receiver threshold voltage –250 mV Vthd Data receiver threshold voltage 75 mV 100BASE-TX PARAMETER DESCRIPTION MIN TYP MAX UNIT Vth Receiver differential voltage to maintain link 200 mV PARAMETER MEASUREMENT INFORMATION Outputs are driven to a minimum high-logic level of 2.4 V and to a maximum low-logic level of 0.6 V. Output transition times are specified as follows: For a high-to-low transition on either an input or output signal, the level at which the signal is said to be no longer high is 2 V and the level at which the signal is said to be low is 0.8 V. For a low-to-high transition, the level at which the signal is no longer said to be low is 0.8 V and the level at which the signal is said to be high is 2 V, as shown in the following diagram. 2 V (high) 0.8 V (low) The rise and fall times are not specified, but are assumed to be those of standard TTL devices, which are typically 1.5 ns. test measurement The test and load circuit shown in Figure 27 represents the programmable load of the tester-terminal electronics used to verify timing parameters of the TNETE2101 output signals. TTL OUTPUT TEST LOAD CL IOH VLOAD IOL Test Point TTL Output Under Test Where: IOL = Refer to IOL in recommended operating conditions. IOH = Refer to IOH in recommended operating conditions. VLOAD = 1.5 V, typical dc-level verification or 1.5 V, typical timing verification CL = 45 pF, typical load-circuit capacitance Figure 27. Test and Load Circuit |
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