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L6740L 数据表(PDF) 32 Page - STMicroelectronics |
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L6740L 数据表(HTML) 32 Page - STMicroelectronics |
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32 / 44 page ![]() Output voltage monitoring and protections L6740L 32/44 – Permanently sets the PWM of the non-involved section to HiZ while keeping ENDRV of the non-involved section low in order to realize an HiZ condition of the non-involved section. – Drives the OSC/ FLT pin high. – Power supply or EN pin cycling is required to restart operations. The OV threshold needs to be programmed through the OVP pin. Connecting the OVP pin to SGND through a resistor ROVP, the OVP threshold becomes the voltage present at the pin. Since the OVP pin sources a constant IOVP=11µA current, the programmed voltage becomes: => Filter OVP pin with 100pF(max) to SGND. 7.2 Feedback disconnection L6740L provides both CORE and NB sections with FB Disconnection protection. This fea- ture acts in order to stop the device from regulating dangerous voltages in case the remote sense connections are left floating. The protection is available for both the sections and operates for both the positive and negative sense. According to Figure 13, the protection works as follow: ● CORE Section: Positive sense is performed monitoring the CORE output voltage through both VSEN and CS1-. As soon as CS1- is more than 600mV higher than VSEN, the device latches with all PWMx set to HiZ and ENDRVx set to zero. FLT pin is driven high. A 30 µA pull- down current on the VSEN forces the device to detect this fault condition. Negative sense is performed monitoring the internal opamp used to recover the SGND losses by comparing its output and the internal reference generated by the DAC. As soon as the difference between the output and the input of this opamp is higher than 500mV, the device latches with all PWMx set to HiZ and ENDRVx set to zero. FLT pin is driven high. ● NB Section (SVI Only) Positive sense is performed sourcing a 50 µA current that pulls-up the NB_VSEN pin in order to force the device to detect an OV condition for the NB Section. Negative sense is performed monitoring the internal opamp used to recover the SGND losses by comparing its output and the internal reference generated by the DAC. As soon as the difference between the output and the input of this opamp is higher than 500mV, the device latches with all PWMx set to HiZ and ENDRVx set to zero. FLT pin is driven high. To recover from a latch condition, cycle VCC or EN. OVP TH R OVP 11 µA ⋅ = R OVP OVP TH 11 µA -------------------- = |
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