| 数据搜索系统,热门电子元器件搜索 |
|
M39832 数据表(PDF) 3 Page - STMicroelectronics |
|
|
|||||||||||||||||||||||||||||
M39832 数据表(HTML) 3 Page - STMicroelectronics |
|
3 / 36 page ![]() programmed on DQ0-DQ7. In this mode, DQ8- DQ14 are at high impedance and DQ15A–1 is the LSB address bit, making the Flash array to be accessed with A–1-A18 Adress lines. In this mode, data in the EEPROM array (x8) are read and programmed on DQ0-DQ7 and the array is ac- cessed with A–1-A13. The 64 bytes OTP are read and programmed on DQ0-DQ7 and are accessed with A-1 - A4 and A6 = 0. Address Inputs (A0-A18). The address inputs for the memory array are latched during a write opera- tion on the falling edge at Chip Enable (EE or EF) or Write Enable W. In Word-wide organisation the address lines are A0-A18, in Byte-wide organisa- tion DQ15A–1 acts as an additional LSB address line. When A9 is raised to VID, either a Read Electronic Signature Manufacturer or Device Code, Block Protection Status or a Write Block Protection or Block Unprotection is enabled depending on the combination of levels on A0, A1, A6, A12 and A15. Data Input/Output (DQ0-DQ7). The s e In- puts/Outputs are used in the Byte-wide and Word- wide organisations. The input is data to be programmed in the memory array or a command to be written. Both are latched on the rising edge of Chip Enable (EE or EF) or Write Enable W. The output is data from the Memory Array, the Elec- tronic Signature Manufacturer or Device codes, the Block Protection Status or the Status register Data Polling bit DQ7, the Toggle Bits DQ6 and DQ2, the Error bit DQ5 or the Erase Timer bit DQ3. Outputs are valid when Chip Enable (EE or EF) and Output Enable G are active. The output is high impedance when the chip is deselected or the outputs are disabled and when RP is at a Low level. Data Input/Outputs (DQ8-DQ14 and DQ15A–1). These Inputs/Outputs are additionally used in the Word-wide organisation. When BYTE is High DQ8- DQ14 and DQ15A–1 act as the MSB of the Data Input or Output, functioning as described for DQ0- DQ7 above, and DQ8 - DQ15 are ’don’t care’ for command inputs or status outputs. When BYTE is Low, DQ8-DQ14 are high impedance, DQ15A–1 is the Address A–1 input. Memory Array Enable (EE and EF). The Memory Array Enable (EE or EF) activates the memory control logic, input buffers, decoders and sense amplifiers. When the EE input is driven high, the EEPROM memory array is not selected; when the EF input is driven high, the Flash memory array is not selected. Attempts to access both EEPROM and Flash arrays (EE low and EF low) are forbid- den. Switching between the two memory array enables (EE and EF) must not be made on the same clock cycle, a delay of greater than tEHFL must be inserted. The M39832 is in standby when both EF and EE are High (when no internal Erase or programming is running). The power consumption is reduced to the standby level and the outputs are in the high impedance state, independent of the Output En- able G or Write Enable W inputs. After 150ns of inactivity and when the addresses are driven at CMOS levels, the chip automatically enters a pseudo standby mode where consumption is reduced to the CMOS standby value, while the outputs continue to drive the bus. Output Enable (G). The Output Enable gates the outputs through the data buffers during a read operation. The data outputs are in the high imped- ance state when the Output Enable G is High. During Block Protect and Block Unprotect opera- tions, the G input must be forced to VID level (12V + 0.5V) (for Flash memory array only). Symbol Parameter Value Unit TA Ambient Operating Temperature –40 to 85 °C TBIAS Temperature Under Bias –50 to 125 °C TSTG Storage Temperature –65 to 150 °C VIO (2) Input or Output Voltages –0.6 to 5 V VCC Supply Voltage –0.6 to 5 V VA9, VG, VEF (2) A9, G, EF Voltage –0.6 to 13.5 V Notes: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant quality documents. 2. Minimum Voltage may undershoot to –2V during transition and for less than 20ns. Table 2. Absolute Maximum Ratings (1) 3/36 M39832 |
|
链接网址 |
| ALLDATASHEET是否为您带来帮助? [ DONATE ] |
关于 Alldatasheet | 广告服务 | 联系我们 | 隐私政策 | 数据表链接 | 链接交换 | 制造商名单 All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |