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M7010R 数据表(PDF) 62 Page - STMicroelectronics |
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M7010R 数据表(HTML) 62 Page - STMicroelectronics |
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62 / 67 page ![]() M7010R 62/67 Table 36. Right-Shift of SRAM Signals for TLSZ Values Table 37. Right-Shift of SRAM Signals for HLAT Values JTAG (1149.1) TESTING The M7010R supports the Test Access Port (TAP) and Boundary Scan Architecture as specified in the IEEE JTAG standard 1149.1. The pin interface to the chip consists of five signals with the stan- dard definitions: TCK, TMS, TDI, TDO, and TRST_L. Table 38, page 62 describes the opera- tions that the test access port controller supports. Table 39 shows the TAP Device ID Register. Note: To disable JTAG functionality, connect the TCK, TMS, and TDI pins to VDDQ through a pull- up, and the TRST_L to ground through a pull- down. Table 38. Test Access Port Controller Instructions Table 39. TAP Device ID Register TLSZ Number of CLK Cycles 00 0 01 1 10 2 HLAT Number of CLK Cycles 000 0 001 1 010 2 011 3 100 4 101 5 110 6 111 7 Instruction Type Description SAMPLE/PRELOAD Mandatory Sample/Preload. Loads the values of signals going to and from IO pins into the boundary scan shift register to provide a snapshot of the normal functional operation. EXTEST Mandatory External Test. Uses boundary scan values shifted in from TAP to test connectivity external to the device. INTEST Optional Internal Test. Allows slow-speed, functional testing of the device using the boundary scan register to provide the I/O values. Field Range Initial Value Description Revision [31:28] 0001 Revision Number. This is the current device revision number. Numbers start from one and increment by one for each revision of the device. Part # [27:12] 0000 0000 0000 0001 This is the part number for this device. MFID [11:1] 000_1101_1100 Manufacturer ID. This field is the same as the manufacturer ID used in the TAP controller. LSB [0:0] 1 Least Significant Bit |
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