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SBPH400-3 数据表(PDF) 34 Page - STMicroelectronics

部件名 SBPH400-3
功能描述  IEEE1394 3-Port 400Mbps Physical Layer
PDF  43 Pages
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制造商  STMICROELECTRONICS [STMicroelectronics]
网页  http://www.st.com
标志 STMICROELECTRONICS - STMicroelectronics

SBPH400-3 数据表(HTML) 34 Page - STMicroelectronics

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SBPH400-3
Some pins on the SBPH400 have different functionality in various test modes. Table 3.2
identifies these pins for ease of reference, but the full description of the associate functions is
not included in this data sheet.
SCLK
60
O
Clock to Link device - 49.152 MHz
TPA1
1
I/O
Positive signal of cable pair A of port 1
TPA1#
2
I/O
Negative signal of cable pair A of port 1
TPB1
3
I/O
Positive signal of cable pair B of port 1
TPB1#
4
I/O
Negative signal of cable pair B of port 1
TPA2
7
I/O
Positive signal of cable pair A of port 2
TPA2#
8
I/O
Negative signal of cable pair A of port 2
TPB2
9
I/O
Positive signal of cable pair B of port 2
TPB2#
10
I/O
Negative signal of cable pair B of port 2
TPA3
16
I/O
Positive signal of cable pair A of port 3
TPA3#
17
I/O
Negative signal of cable pair A of port 3
TPB3
18
I/O
Positive signal of cable pair B of port 3
TPB3#
19
I/O
Negative signal of cable pair B of port 3
TPBIAS1
5
O
Cable Termination voltage source for port 1
TPBIAS2
11
O
Cable Termination voltage source for port 2
TPBIAS3
20
O
Cable Termination voltage source for port 3
Table 3.2
Pin description - test pins
Pin name
Pin number
I/O
Description
CLK98
35
I
98.304 MHz Oscillator input, used when PLLDIS is tied to VDD
PLLDIS
49
I
Internal PLL disable pin. Tie to VDD to disable internal PLL.
SCI[0:2]
76, 67, 65
I
Used to serially shift data into the SBPH400 for production test
SCO[0:2]
68, 66, 64
I
Used to serially shift data out of the SBPH400 for production test
TCK
72
I
Test clock. Used to clock data into and out of the SBPH400 during
operation of the Test Access Port or production test.
TDI
75
I
Test Data Input. Used to serially shift test data and test instructions
into the SBPH400 during TAP operations.
TDO
63
O
Test Data Output. Used to serially shift test data and test
instructions out of the SBPH400 during TAP operations.
TEST
ENABLE
70
I
Reserved for production test
TESTMODE
30
I
Reserved for production test
TMS
69
I
Test Mode Select. This signal controls the state of the TAP
controller within the SBPH400.
TRST#
40
I
Test Reset. Resets the TAP controller.
Table 3.1
Pin description - normal operation (continued)
Pin name
Pin number
I/O
Description



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