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16

Freescale Semiconductor

MC44CC373

The Test Mode bits, X5:X0, found in the frequency and

control registers, control 15 different test mode states. Only

four of these states have an application use. All other states

are intended for manufacturing test purposes only.

The test mode states defined by X2:X0 in Table 18 may be

used to operate the modulator in the in VHF range.

It should be noted that operation in the VHF range has

a high spurious content due to the digital dividers.

desired performance specifications. Performance

data is not provided for VHF operation.

OPTION CONTROL REGISTER 1 FORMAT

The format for the Optional Control Register 1, OCR1, is

shown in Figure 8. Bits R14:R0 are not defined for system

applications. They are for manufacturing test only. For nor-

mal operation these bits must be set to a logic 0. When

UHF oscillator is disabled, do not write to Option Control Reg-

ister 1 and 2. Any other time, writing to Option Control Regis-

ters 1 and 2 is allowed.

Table 18. Test Modes usable for VHF operation

X5

X4

X3

X2

X1

X0

Description

0

0

0

0

0

0

Normal Operation

0

0

0

0

0

1

RF/2

0

0

0

0

1

0

RF4

0

0

0

0

1

1

RF/8

0

0

0

1

0

0

RF/16

x

x

x

1

x

x

The 11 other test mode states are reserved for manufacturing test purposes.

MSB

LSB

R15

R14

R13

R12

R11

R10

R9

R8

R7

R6

R5

R4

R3

R2

R1

R0

1

0

0

0

0

0

0

0

0

0

0

0

0

0

0

0

Reset

State

1

Reserved for manufacturing test purposes only

Reserved for manufacturing test purposes only

Adr

Figure 8. Option Control Register 1 Format

Table 19. Option Control Register 1, Bit Description

Bit

Name

Description

15

Adr

Address Function bit. Must be set to a logic 1.

14-8

—

Reserved for manufacturing test.

7-0

—

Reserved for manufacturing test.