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MPC8343VRAGDB 数据表(PDF) 29 Page - Freescale Semiconductor, Inc |
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MPC8343VRAGDB 数据表(HTML) 29 Page - Freescale Semiconductor, Inc |
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29 / 79 page ![]() MPC8343EA PowerQUICC II Pro Integrated Host Processor Hardware Specifications, Rev. 10 Freescale Semiconductor 29 USB 9USB This section provides the AC and DC electrical specifications for the USB interface of the MPC8343EA. 9.1 USB DC Electrical Characteristics Table 31 provides the DC electrical characteristics for the USB interface. 9.2 USB AC Electrical Specifications Table 32 describes the general timing parameters of the USB interface of the MPC8343EA. Table 31. USB DC Electrical Characteristics Parameter Symbol Min Max Unit High-level input voltage VIH 2OVDD +0.3 V Low-level input voltage VIL –0.3 0.8 V Input current IIN —±5 μA High-level output voltage, IOH = –100 μAVOH OVDD –0.2 — V Low-level output voltage, IOL = 100 μAVOL —0.2 V Table 32. USB General Timing Parameters (ULPI Mode Only) Parameter Symbol1 Min Max Unit Notes USB clock cycle time tUSCK 15 — ns 2–5 Input setup to USB clock—all inputs tUSIVKH 4 — ns 2–5 Input hold to USB clock—all inputs tUSIXKH 1 — ns 2–5 USB clock to output valid—all outputs tUSKHOV — 7 ns 2–5 Output hold from USB clock—all outputs tUSKHOX 2 — ns 2–5 Notes: 1. The symbols for timing specifications follow the pattern of t(first two letters of functional block)(signal)(state)(reference)(state) for inputs and t(first two letters of functional block)(reference)(state)(signal)(state) for outputs. For example, tUSIXKH symbolizes USB timing (US) for the input (I) to go invalid (X) with respect to the time the USB clock reference (K) goes high (H). Also, tUSKHOX symbolizes USB timing (US) for the USB clock reference (K) to go high (H), with respect to the output (O) going invalid (X) or output hold time. 2. All timings are in reference to USB clock. 3. All signals are measured from OVDD/2 of the rising edge of the USB clock to 0.4 × OVDD of the signal in question for 3.3 V signaling levels. 4. Input timings are measured at the pin. 5. For active/float timing measurements, the Hi-Z or off-state is defined to be when the total current delivered through the component pin is less than or equal to that of the leakage current specification. |
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