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MMA6901K 数据表(PDF) 18 Page - Freescale Semiconductor, Inc |
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MMA6901K 数据表(HTML) 18 Page - Freescale Semiconductor, Inc |
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18 / 36 page ![]() Sensors 18 Freescale Semiconductor MMA690xQ 3.1.1.3 Device Initialization Class: Reset Following a reset condition, the device requires a period of time to complete initialization of the DSP and internal registers. If multiple SPI transfers are attempted during this initialization period, the second and all subsequent transfers will result in this status. The first transfer following reset, regardless of the state of initialization returns device reset status. This exception condition is cleared automatically upon completion of device initialization. 3.1.1.4 Temperature Fault Class: Critical The internal temperature sensor value exceeds the allowable limits for the device. This exception condition may be cleared by writing a logic ‘1’ to the CE bit in DEVCTL, provided that the temperature has returned to within the operating limits of the device. 3.1.1.5 Unexpected Axis Selection Class: Transient An acceleration data request has been received with an axis specification which is not supported. This exception condition is reported during the subsequent transfer. 3.1.1.6 Device Reset Class: Reset This exception condition is latched any time the device undergoes reset. Device response will indicate the exception condition in lieu of acceleration data.The device reset exception condition must be explicitly cleared by writing a logic ‘1’ to the CE bit in DEVCTL. 3.1.1.7 SPI Clock Fault Class: Transient A SPI clock fault may result from the following conditions: • The number of rising clock edges detected while CS is asserted is not equal to the expected number for the selected communications protocol • SCLK is high when CS is asserted This exception condition is reported during the subsequent transfer. 3.1.1.8 DIN Parity Fault Class: Transient A parity error was detected on DIN during a data transmission. This exception condition is reported during the subsequent transfer. 3.1.1.9 HOLD Condition A HOLD condition exists when the CAP/HOLD pin is driven to a logic high level. Self-test activation is controlled through con- figuration of ST1 and ST0 in DEVCTL. 3.1.1.10 Self-Test Activation Class: Behavioral The device provides two status bits in its response which will indicate a behavioral exception condition if a HOLD condition exists or self-test is activated. As these are not error conditions, device response is otherwise unaffected. Refer to Section 3.2.1 for details regarding device response to behavioral exception conditions. A HOLD condition exists when the CAP/HOLD pin is driven to a logic level high level. Self-test activation is controlled through configuration of ST1 and ST0 in DEVCTL. |
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