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WM72016 数据表(PDF) 23 Page - Ramtron International Corporation

部件名 WM72016
功能描述  16Kbit Secure F-RAM Memory with Gen-2 RFID Access & Serial Port Direct Memory Access
PDF  32 Pages
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制造商  RAMTRON [Ramtron International Corporation]
网页  http://www.ramtron.com
标志 RAMTRON - Ramtron International Corporation

WM72016 数据表(HTML) 23 Page - Ramtron International Corporation

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WM72016 – Secure F-RAM with Gen-2 RFID and Serial Port
Rev. 1.4
May 2011
Page 23 of 32
SPECIFICATIONS
WM72016‟s RFID Interface conforms to the Specification for RFID Air Interface EPC Class-1 Generation-2 UHF
RFID Protocol for Communications at 860 MHz – 960 MHz, Version 1.2.0.
Options and Exceptions are noted here:
State Persistence Requirements
WM72016 features infinite state retention for S1, S2, S3, and SL State flags. State flag S0 has no persistence
and will always return to state „A‟ upon a power cycle.
ELECTRICAL SPECIFICATIONS
ABSOLUTE MAXIMUM RATINGS
Symbol
Description
Ratings
Notes
VDDR,
VDDRAW
Power Supply Voltage with respect to ANT-
-1.0V to +4.5V
VIN
Voltage on any serial port pin with respect to ANT-
-1.0V to +4.5V
and VIN < VDD+1.0V
TSTG
Storage Temperature
-55C to + 125C
TOP
Operating Temperature
-40
oC to +85oC
TLEAD
Lead Temperature (Soldering, 10 seconds)
260 C
VESD
(ANT+, ANT-)
Electrostatic Discharge Voltage
- Human Body Model (JEDEC Std JESD22-A114-B)
- Charged Device Model (JEDEC Std JESD22-C101-A)
- Machine Model (JEDEC Std JESD22-A115-A)
500V
1kV
50V
VESD
(All other pins)
Electrostatic Discharge Voltage
- Human Body Model (JEDEC Std JESD22-A114-B)
- Charged Device Model (JEDEC Std JESD22-C101-A)
- Machine Model (JEDEC Std JESD22-A115-A)
1.5kV
1.5kV
200V
ME
Memory Endurance: Read or Write or Erase
1x10
14
1
RFexp
RF Exposure
+10dBm
(800 ~ 1000 MHz)
Package Moisture Sensitivity Level
MSL-2
1.
A degradation in memory endurance may occur for VDDR_EXT levels beyond the maximum specification.
Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only, and
the functional operation of the device at these or any other conditions above those listed in the operational section of this specification is
not implied. Exposure to absolute maximum ratings conditions for extended periods may affect device reliability.



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