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bq76PL536APAP 数据表(PDF) 23 Page - Texas Instruments |
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bq76PL536APAP 数据表(HTML) 23 Page - Texas Instruments |
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23 / 60 page ![]() bq76PL536A www.ti.com SLUSAD3A – JUNE 2011 – REVISED AUGUST 2012 Table 2. Fault Detection Summary SIGNALING FAULT DETECTION PIN DEVICE_STATUS X_STATUS BIT SET BIT SET HSEL = 1 HSEL = 0 EPROM double bit ECC logic fault detected FAULT_S FAULT_H FAULT FAULT_STATUS[I_FAULT] error FORCE User set FORCE bit FAULT_S FAULT_H FAULT FAULT_STATUS[FORCE] POR Power-on reset occurred FAULT_S FAULT_H FAULT FAULT_STATUS[POR] CRC(1) CRC fail on received packet FAULT_S FAULT_H FAULT FAULT_STATUS[CRC] CUV VCx < VUV for tUV FAULT_S FAULT_H FAULT FAULT_STATUS[CUV] COV VCx > VOV for tOV FAULT_S FAULT_H FAULT FAULT_STATUS[COV] AR Address ≠ (0x01→ 0x3e) ALERT_S ALERT_H ALERT ALERT_STATUS[AR] Protected-register Parity not even in protected ALERT_S ALERT_H ALERT ALERT_STATUS[PARITY] parity error register EPROM single-bit ECC logic fault detected and ALERT_S ALERT_H ALERT ALERT_STATUS[ECC_COR] error corrected FORCE User set FORCE bit ALERT_S ALERT_H ALERT ALERT_STATUS[FORCE] Die temperature ≥ Thermal shutdown ALERT_S ALERT_H ALERT ALERT_STATUS[TSD] TSDTHRESHOLD SLEEP IC exited SLEEP mode ALERT_S ALERT_H ALERT ALERT_STATUS[SLEEP] OT2 VTS2 > VOT for tOT ALERT_S ALERT_H ALERT ALERT_STATUS[OT2] OT1 VTS1 > VOT for tOT ALERT_S ALERT_H ALERT ALERT_STATUS[OT1] (1) The CRC fault may be prevented from setting the FAULT pin by setting IO_CONFIG[7] = 1. The FAULT_STATUS[CRC] bit is still set when CRC error is detected, but the FAULT pin remains de-asserted. Fault Recovery Procedure When any error flag in DEVICE_STATUS[], FAULT_STATUS[], or ALERT_STATUS[] is set and latched, the state can only be cleared by host communication via SPI. Writing to the respective FAULT_STATUS or ALERT_STATUS register bit with a 1 clears the latch for that bit. The exceptions are the two FORCE bits, which are cleared by writing a 0 to the bit. The FAULT_STATUS[] and ALERT_STATUS[] register bits are read-only, with the exception of the FORCE bit, which may be directly written to either a 1 or 0. Secondary Protector Built-In Self-Test Features The secondary protector functions have built-in test for verifying the connections through the signal chain of ICs in the stack back to the host CPU. This verifies the wiring, connections, and signal path through the ICs by forcing a current through the signal path. To implement this feature, host firmware should set the FAULT[FORCE] or ALERT[FORCE] bit in the top-most device in the stack. The device asserts the associated pin on the South interface, and it propagates down the stack, back to the base device. The base device in turn asserts the FAULT_H (ALERT_H) pin to the host, allowing the host to check for the received signal and thereby verify correct operation. CELL BALANCING The bq76PL536A has six dedicated outputs (CB1…CB6) that can be used to control external N-FETs as part of a cell balancing system. The implementation of appropriate algorithms is controlled by the system host. The CB_CTRL[CBAL1–6] bits control the state of each of the outputs. The outputs are copied from the bit state of the CB_CTRL register, i.e., a 1 in this register activates the external balance FET by placing a high on the associated pin. The CBx pins switch between approximately the positive and negative voltages of the cell across which the external FET is connected. This allows the use of a small, low-cost N-FET in series with a power resistor to provide cell balancing. Copyright © 2011–2012, Texas Instruments Incorporated Submit Documentation Feedback 23 Product Folder Links :bq76PL536A |
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