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C2.5X6.3MM-RAD 数据表(PDF) 12 Page - Silicon Laboratories |
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C2.5X6.3MM-RAD 数据表(HTML) 12 Page - Silicon Laboratories |
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12 / 38 page ![]() Si3226/7 Si3208/9 12 Preliminary Rev. 0.33 Table 11. Switching Characteristics—PCM Highway Interface (VDD = 3.13 to 5.25 V, TA = 0 to 70 °C for F-Grade, –40 to 85 °C for G-Grade, CL =20pF) Parameter Symbol Test Conditions Min1 Typ1 Max1 Units PCLK Period tp 122 — 3906 ns Valid PCLK Inputs — — — — — — — — 512 768 1.024 1.536 1.544 2.048 4.096 8.192 — — — — — — — — kHz kHz MHz MHz MHz MHz MHz MHz FSYNC Period2 tfs —125 — µs PCLK Duty Cycle Tolerance tdty 40 50 60 % FSYNC Jitter Tolerance tjitter — — ±120 ns Rise Time, PCLK tr — — 25 ns Fall Time, PCLK tf — — 25 ns Delay Time, PCLK Rise to DTX Active td1 — — 20 ns Delay Time, PCLK Rise to DTX Transition td2 — — 20 ns Delay Time, PCLK Rise to DTX Tristate3 td3 — — 20 ns Setup Time, FSYNC to PCLK Fall tsu1 25 — — ns Hold Time, FSYNC to PCLK Fall th1 20 — — ns Setup Time, DRX to PCLK Fall tsu2 25 — — ns Hold Time, DRX to PCLK Fall th2 20 — — ns FSYNC Pulse Width twfs tp —125 µs–tp Notes: 1. All timing is referenced to the 50% level of the waveform. Input test levels are VIH – VI/O –0.4 V, VIL =0.4 V. 2. FSYNC source is assumed to be 8 kHz under all operating conditions. 3. Spec applies to PCLK fall to DTX tristate when that mode is selected. |
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