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STM32F479AI 数据表(PDF) 181 Page - STMicroelectronics |
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STM32F479AI 数据表(HTML) 181 Page - STMicroelectronics |
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181 / 208 page ![]() DocID028010 Rev 2 181/208 STM32F479xx Electrical characteristics 187 5.3.30 Quad-SPI interface characteristics Unless otherwise specified, the parameters given in Table 107 and Table 108 for Quad-SPI are derived from tests performed under the ambient temperature, fAHB frequency and VDD supply voltage conditions summarized in Table xx, with the following configuration: • Output speed is set to OSPEEDRy[1:0] = 11 • Measurement points are done at CMOS levels: 0.5 VDD Refer to Section 5.3.20 for more details on the input/output alternate function characteristics. Figure 71. Quad-SPI SDR timing diagram Table 107. Quad-SPI characteristics in SDR mode(1) Symbol Parameter Test conditions Min Typ Max Unit Fck 1/t(CK) Quad-SPI clock frequency 2.7 V ≤ VDD ≤ 3.6 V, CL = 20 pF - - 90 MHz 1.71 V ≤ VDD ≤ 3.6 V, CL = 15 pF -- 84 tw(CKH) Quad-SPI clock high time ‐ t(CK)/2-1 - t(CK)/2 ns tw(CKL) Quad-SPI clock low time ‐ t(CK)/2 - t(CK)/2+1 ts(IN) Data input set-up time ‐ 0.5 - - th(IN) Data input hold time ‐ 3- - tv(OUT) Data output valid time ‐ -3 4 th(OUT) Data output hold time ‐ 2.5 - - 1. Guaranteed based on test during characterization. |
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