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DP8390DV 数据表(PDF) 38 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
部件名 DP8390DV
功能描述  NIC Network Interface Controller
PDF  56 Pages
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制造商  NSC [National Semiconductor (TI)]
网页  http://www.national.com
标志 NSC - National Semiconductor (TI)

DP8390DV 数据表(HTML) 38 Page - National Semiconductor (TI)

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140 Preliminary Electrical Characteristics
Absolute Maximum Ratings
If MilitaryAerospace specified devices are required
please contact the National Semiconductor Sales
OfficeDistributors for availability and specifications
Supply Voltage (VCC)
b
05V to a70V
DC Input Voltage (VIN)
b
05V to VCC a 05V
DC Output Voltage (VOUT)
b
05V to VCC a 05V
Storage Temperature Range (TSTG)
b
65 Cto a150 C
Power Dissipation (PD)
500 mW
Lead Temp (TL) (Soldering 10 sec)
260 C
ESD rating (RZAP e 15k CZAP e 120 pF)
1600V
Preliminary DC Specifications TA e 0 Cto70 C VCC e 5V g5% unless otherwise specified
Symbol
Parameter
Conditions
Min
Max
Units
VOH
Minimum High Level Output Voltage
IOH eb20 mAVCC b 01
V
(Notes 1 4)
IOH eb20 mA
35
V
VOL
Minimum Low Level Output Voltage
IOL e 20 mA
01
V
(Notes 1 4)
IOL e 20 mA
04
V
VIH
Minimum High Level Input Voltage
20
V
(Note 2)
VIH2
Minimum High Level Input Voltage
27
V
for RACK WACK (Note 2)
VIL
Minimum Low Level Input Voltage
08
V
(Note 2)
VIL2
Minimum Low Level Input Voltage
06
V
For RACK WACK (Note 2)
IIN
Input Current
VI e VCC or GND
b
10
a
10
m
A
IOZ
Maximum TRI-STATE
VOUT e VCC or GND
b
10
a
10
m
A
Output Leakage Current
ICC
Average Supply Current
TXCK e 10 MHz
(Note 3)
RXCK e 10 MHz
BSCK e 20 MHz
40
mA
IOUT e 0 mA
VIN e VCC or GND
Note 1
These levels are tested dynamically using a limited amount of functional test patterns please refer to AC Test Load
Note 2
Limited functional test patterns are performed at these input levels The majority of functional tests are performed at levels of 0V and 3V
Note 3
This is measured with a 01 mF bypass capacitor between VCC and GND
Note 4
The low drive CMOS compatible VOH and VOL limits are not tested directly Detailed device characterization validates that this specification can be
guaranteed by testing the high drive TTL compatible VOL and VOH specification
38



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